Microwave loss of DC sputtered NbTiN microstrip lines
文献类型：期刊论文
| 作者 | Shan, Wenlei1; Sekimoto, Yutaro2; Noguchi, Takashi2 |
| 刊名 | JAPANESE JOURNAL OF APPLIED PHYSICS
 |
| 出版日期 | 2015-09-01 |
| 卷号 | 54期号:9页码:90303 |
| 英文摘要 | Amorphous NbTiN is widely applied in superconducting electronic devices owing to its merits of wide energy gap, high Tc, and mitigated requirement in fabrication. Its highly disordered feature yields considerable kinetic inductance, making it an ideal material for parametric amplification. To build up the correspondence between the fabrication conditions and the desirable electrical performance, we designed, fabricated, and measured NbTiN microstrip resonators at microwave frequencies. The principal result is that the unloaded Q factor of the resonators does not depend on the film normal state resistivity, which largely depends on the sputtering pressure. This result is consistent with the dirty superconductor theories. (C) 2015 The Japan Society of Applied Physics |
| WOS标题词 | Science & Technology ; Physical Sciences |
| 学科主题 | 天文和天体物理 |
| 类目[WOS] | Physics, Applied |
| 研究领域[WOS] | Physics |
| 关键词[WOS] | FILMS |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000362024900003 |
| 源URL | [http://libir.pmo.ac.cn/handle/332002/14803]  |
| 专题 | 紫金山天文台_毫米波和亚毫米波技术实验室 |
| 作者单位 | 1.Chinese Acad Sci, Purple Mt Observ, Nanjing 210008, Jiangsu, Peoples R China 2.Natl Astron Observ Japan, Mitaka, Tokyo 1818588, Japan |
| 推荐引用方式 GB/T 7714 | Shan, Wenlei,Sekimoto, Yutaro,Noguchi, Takashi. Microwave loss of DC sputtered NbTiN microstrip lines[J]. JAPANESE JOURNAL OF APPLIED PHYSICS,2015,54(9):90303. |
| APA | Shan, Wenlei,Sekimoto, Yutaro,&Noguchi, Takashi.(2015).Microwave loss of DC sputtered NbTiN microstrip lines.JAPANESE JOURNAL OF APPLIED PHYSICS,54(9),90303. |
| MLA | Shan, Wenlei,et al."Microwave loss of DC sputtered NbTiN microstrip lines".JAPANESE JOURNAL OF APPLIED PHYSICS 54.9(2015):90303. |
入库方式： OAI收割
来源：紫金山天文台
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