Evolution of the SrTiO3-MoO3 Interface Electronic Structure: An in Situ Photoelectron Spectroscopy Study
文献类型:期刊论文
作者 | Du, YM; Peng, HY; Mao, HY; Jin, KX; Wang, H; Li, F; Gao, XY; Chen, W; Wu, T |
刊名 | ACS APPLIED MATERIALS & INTERFACES
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出版日期 | 2015 |
卷号 | 7期号:21页码:11309—11314 |
关键词 | SCHOTTKY-BARRIER HEIGHTS TRANSITION-METAL OXIDES THIN-FILMS MOLYBDENUM TRIOXIDE SURFACE LAYER RESISTANCE GAS MEMORY STATES |
英文摘要 | Modifying the surface energetics, particularly the work function of advanced materials, is of critical importance for a wide range of surface- and interface-based devices. In this work, using in situ photoelectron spectroscopy, we investigated the evolution of electronic structure at the SrTiO3 surface during the growth of ultra-thin MoO3 layers. Because of the large work function difference between SrTiO3 and MoO3, the energy band alignment on the SrTiO3 surface is significantly modified. The charge transfer and dipole formation at the SrTiO3-MoO3 interface leads to a large modulation of work function and to apparent doping in SrTiO3. The measured evolutions of electronic structure and upward band bending suggest that the growth of ultra-thin MoO3 layers is a powerful tool with which to modulate the surface energetics of SrTiO3, and this surface engineering approach could be generalized to other functional oxides. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2015-12-24 |
源URL | [http://ir.sinap.ac.cn/handle/331007/24457] ![]() |
专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
推荐引用方式 GB/T 7714 | Du, YM,Peng, HY,Mao, HY,et al. Evolution of the SrTiO3-MoO3 Interface Electronic Structure: An in Situ Photoelectron Spectroscopy Study[J]. ACS APPLIED MATERIALS & INTERFACES,2015,7(21):11309—11314. |
APA | Du, YM.,Peng, HY.,Mao, HY.,Jin, KX.,Wang, H.,...&Wu, T.(2015).Evolution of the SrTiO3-MoO3 Interface Electronic Structure: An in Situ Photoelectron Spectroscopy Study.ACS APPLIED MATERIALS & INTERFACES,7(21),11309—11314. |
MLA | Du, YM,et al."Evolution of the SrTiO3-MoO3 Interface Electronic Structure: An in Situ Photoelectron Spectroscopy Study".ACS APPLIED MATERIALS & INTERFACES 7.21(2015):11309—11314. |
入库方式: OAI收割
来源:上海应用物理研究所
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