中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Comparison of refraction information extraction methods in diffraction enhanced imaging

文献类型:期刊论文

作者Hu, Chunhong1,2; Zhang, Lu1; Li, Hui1; Luo, Shuqian1
刊名OPTICS EXPRESS
出版日期2008-10-13
卷号16期号:21页码:16704-16710
英文摘要Diffraction enhanced imaging (DEI) is a powerful phase-sensitive technique that generates the improved contrast of weakly absorbing samples compared to conventional radiography. The x-ray refraction contrast of the sample is an important contrast in DEI, and it vastly exceeds the absorption contrast for weakly absorbing samples imaging, which makes it hold great promise for medical, biological and material applications. In order to effectively utilize the refraction contrast, the key procedure is first to obtain the refraction information expressed as the refraction image. By comparing the signal-to-noise ratio (SNR) of the refraction image, x-ray radiation dose of the sample and the range of obtained refraction angles, the different refraction information extraction methods are investigated in this paper, and the experimental results confirm the conclusion. (C) 2008 Optical Society of America
WOS标题词Science & Technology ; Physical Sciences
类目[WOS]Optics
研究领域[WOS]Optics
关键词[WOS]COMPUTED-TOMOGRAPHY ; RADIOGRAPHY
收录类别SCI
语种英语
WOS记录号WOS:000260864900046
公开日期2015-12-24
源URL[http://ir.ia.ac.cn/handle/173211/9569]  
专题自动化研究所_09年以前成果
作者单位1.Capital Med Univ, Coll Biomed Engn, Beijing 100069, Peoples R China
2.Chinese Acad Sci, Inst Automat, Nat Lab Pattern Recognit, Beijing 100080, Peoples R China
推荐引用方式
GB/T 7714
Hu, Chunhong,Zhang, Lu,Li, Hui,et al. Comparison of refraction information extraction methods in diffraction enhanced imaging[J]. OPTICS EXPRESS,2008,16(21):16704-16710.
APA Hu, Chunhong,Zhang, Lu,Li, Hui,&Luo, Shuqian.(2008).Comparison of refraction information extraction methods in diffraction enhanced imaging.OPTICS EXPRESS,16(21),16704-16710.
MLA Hu, Chunhong,et al."Comparison of refraction information extraction methods in diffraction enhanced imaging".OPTICS EXPRESS 16.21(2008):16704-16710.

入库方式: OAI收割

来源:自动化研究所

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