Including the Effects of Process-Related Variability on Radiation Response in Advanced Foundry Process Design Kits
文献类型：期刊论文
| 作者 | Li, Yanfeng1; Rezzak, Nadia2; Zhang, En Xia2; Schrimpf, Ronald D.2; Fleetwood, Daniel M.2; Wang, Jingqiu3 ; Wang, Donglin3; Wu, Yanjun1; Cai, Shuang1
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| 刊名 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE
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| 出版日期 | 2010-12-01 |
| 卷号 | 57期号:6页码:3570-3574 |
| 关键词 | Mismatch process design kit process variability radiation effects stress TID |
| 英文摘要 | Space applications using advanced foundry processes require device models that accurately include the dependence of total-ionizing dose (TID) response on process variability and layout. An automated flow is described for TID-aware process design kit generation using new test chips, modeling, and simulation. The variability of TID-induced leakage current and transistor mismatch both increase after irradiation. |
| WOS标题词 | Science & Technology ; Technology |
| 类目[WOS] | Engineering, Electrical & Electronic ; Nuclear Science & Technology |
| 研究领域[WOS] | Engineering ; Nuclear Science & Technology |
| 关键词[WOS] | TRANSISTORS |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000285355200082 |
| 公开日期 | 2015-12-24 |
| 源URL | [http://ir.ia.ac.cn/handle/173211/9719]  |
| 专题 | 自动化研究所_国家专用集成电路设计工程技术研究中心 |
| 作者单位 | 1.Accelicon Technol Inc, Cupertino, CA 95014 USA 2.Vanderbilt Univ, Elect Engn & Comp Sci Dept, Nashville, TN 37235 USA 3.Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China |
| 推荐引用方式 GB/T 7714 | Li, Yanfeng,Rezzak, Nadia,Zhang, En Xia,et al. Including the Effects of Process-Related Variability on Radiation Response in Advanced Foundry Process Design Kits[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE,2010,57(6):3570-3574. |
| APA | Li, Yanfeng.,Rezzak, Nadia.,Zhang, En Xia.,Schrimpf, Ronald D..,Fleetwood, Daniel M..,...&Cai, Shuang.(2010).Including the Effects of Process-Related Variability on Radiation Response in Advanced Foundry Process Design Kits.IEEE TRANSACTIONS ON NUCLEAR SCIENCE,57(6),3570-3574. |
| MLA | Li, Yanfeng,et al."Including the Effects of Process-Related Variability on Radiation Response in Advanced Foundry Process Design Kits".IEEE TRANSACTIONS ON NUCLEAR SCIENCE 57.6(2010):3570-3574. |
入库方式： OAI收割
来源：自动化研究所
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