KINEMATICAL STUDY OF GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE BY A DOUBLE CRYSTAL X-RAY-DIFFRACTION METHOD
文献类型：期刊论文
| 作者 | DUAN XF ; WANG YT ; SHENG C ; OUYANG JT |
| 刊名 | philosophical magazine letters
 |
| 出版日期 | 1993 |
| 卷号 | 67期号:1页码:1-7 |
| 关键词 | BEAM ELECTRON-DIFFRACTION |
| ISSN号 | 0950-0839 |
| 通讯作者 | duan xf chinese acad scibeijing lab electr microscopypob 2724beijing 100080peoples r china |
| 中文摘要 | two samples of nominal 20-period ge0.20si0.80(5 nm)/si(25 nm) and ge0.5si0.5(5 nm)/si(25 nm) strained-layer superlattices (slss) were studied by the double-crystal x-ray diffraction method. it is convenient to define the perpendicular strains relative to the average crystal. computer simulations of the rocking curves were performed using a kinematical step model. an excellent agreement between the measured and simulated satellite patterns is achieved. the dependence of the sensitivity of the rocking curves to the structural parameters of the sls, such as the alloying concentration x and the layer thicknesses and the l component of the reflection g = (hkl), are clearly demonstrated. |
| 学科主题 | 半导体材料 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-11-15 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/14115]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | DUAN XF,WANG YT,SHENG C,et al. KINEMATICAL STUDY OF GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE BY A DOUBLE CRYSTAL X-RAY-DIFFRACTION METHOD[J]. philosophical magazine letters,1993,67(1):1-7. |
| APA | DUAN XF,WANG YT,SHENG C,&OUYANG JT.(1993).KINEMATICAL STUDY OF GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE BY A DOUBLE CRYSTAL X-RAY-DIFFRACTION METHOD.philosophical magazine letters,67(1),1-7. |
| MLA | DUAN XF,et al."KINEMATICAL STUDY OF GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE BY A DOUBLE CRYSTAL X-RAY-DIFFRACTION METHOD".philosophical magazine letters 67.1(1993):1-7. |
入库方式： OAI收割
来源：半导体研究所
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