中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Simulation of electrical characteristics of InP/In0.24Ga0.76As0.73Sb0.27/In0.53Ga0.47As double heterojunction bipolar transistor

文献类型:会议论文

作者Zhou, Xingbao; Zhou, Shouli; Wen, Hao; Ren, Hongliang; Huang, Guiyong; Xu, Jun; Wang, Yuhua
出版日期2014
会议名称9th IEEE Conference on Industrial Electronics and Applications, ICIEA 2014
会议日期June 9, 2014 - June 11, 2014
会议地点188-200 Moganshan Road, Hangzhou, China
页码1730-1732
英文摘要The electrical characteristics of InP/In0.24Ga0.76As0.73Sb0.27/In0.53Ga0.47As double heterojunction bipolar transistor (DHBT) are investigated. The study is based on energy balance (EB) transport model and TCAD SILVACO device simulator. InP/In0.24Ga0.76As0.73Sb0.27 DHBT have a low Emitter-Base conduction band discontinuity ΔEC and a minimum base bandgap energy EG among the entire composition range of InxGa1-xAs1-ySby material lattice matched to InP. A low Emitter-Base turn on voltage VBE and a low collector offset voltage VCE, as well as a high current gain cut-off frequency, are achieved.
收录类别EI
会议主办者Hangzhou M.I.C.E. Association; Hangzhou Tourism Commission; Hangzhou Tourism Promotion Center
会议录Proceedings of the 2014 9th IEEE Conference on Industrial Electronics and Applications, ICIEA 2014
会议录出版者Institute of Electrical and Electronics Engineers Inc.
语种英语
ISBN号9781479943166
源URL[http://ir.nssc.ac.cn/handle/122/4353]  
专题国家空间科学中心_空间技术部
推荐引用方式
GB/T 7714
Zhou, Xingbao,Zhou, Shouli,Wen, Hao,et al. Simulation of electrical characteristics of InP/In0.24Ga0.76As0.73Sb0.27/In0.53Ga0.47As double heterojunction bipolar transistor[C]. 见:9th IEEE Conference on Industrial Electronics and Applications, ICIEA 2014. 188-200 Moganshan Road, Hangzhou, China. June 9, 2014 - June 11, 2014.

入库方式: OAI收割

来源:国家空间科学中心

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