An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers
文献类型：期刊论文
| 作者 | Li R; Ye HF; Zhang WS; Ma GJ; Su YW(苏业旺)
|
| 刊名 | SCIENTIFIC REPORTS
 |
| 出版日期 | 2015-10-29 |
| 卷号 | 5页码:15828 |
| 通讯作者邮箱 | ruili@dlut.edu.cn ; yewangsu@imech.ac.cn |
| ISSN号 | 2045-2322 |
| 产权排序 | [Li, Rui; Ye, Hongfei; Zhang, Weisheng; Ma, Guojun] Dalian Univ Technol, Dept Engn Mech, State Key Lab Struct Anal Ind Equipment, Dalian 116024, Peoples R China; [Li, Rui] Huazhong Univ Sci & Technol, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Peoples R China; [Su, Yewang] Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100190, Peoples R China; [Su, Yewang] Northwestern Univ, Dept Civil & Environm Engn, Evanston, IL 60208 USA; [Su, Yewang] Northwestern Univ, Dept Mech Engn, Evanston, IL 60208 USA |
| 通讯作者 | Li, R (reprint author), Dalian Univ Technol, Dept Engn Mech, State Key Lab Struct Anal Ind Equipment, Dalian 116024, Peoples R China. |
| 中文摘要 | Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson's ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers. |
| 学科主题 | 基础力学 |
| 分类号 | 一类 |
| 类目[WOS] | Multidisciplinary Sciences |
| 研究领域[WOS] | Science & Technology - Other Topics |
| 关键词[WOS] | DEVICES |
| 收录类别 | SCI |
| 原文出处 | http://dx.doi.org/10.1038/srep15828 |
| 语种 | 英语 |
| WOS记录号 | WOS:000363625600001 |
| 源URL | [http://dspace.imech.ac.cn/handle/311007/58339]  |
| 专题 | 力学研究所_非线性力学国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Li R,Ye HF,Zhang WS,et al. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers[J]. SCIENTIFIC REPORTS,2015,5:15828. |
| APA | Li R,Ye HF,Zhang WS,Ma GJ,&苏业旺.(2015).An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers.SCIENTIFIC REPORTS,5,15828. |
| MLA | Li R,et al."An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers".SCIENTIFIC REPORTS 5(2015):15828. |
入库方式： OAI收割
来源：力学研究所
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