中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A design of digital processing circuit for the duo-lateral PSD

文献类型:会议论文

作者Zhou, Weixiang1,2; Liang, Yanbing1; Wang, Xiaoyang1,2
出版日期2015
会议名称applied optics and photonics, china: optical and optoelectronic sensing and imaging technology, aopc 2015
会议日期2015-05-05
会议地点beijing, china
英文摘要beam pointing stability control technology detecting the vibration of the optical platform by detectors, using the fast steering mirror compensated the vibration displacement, thereby maintaining a stable beam. position sensitive detector (psd) as a sensitive position detection system components, its performance significantly affect the overall accuracy of the test system. this article selects sitek's two-dimensional duo-lateral psd: 2l20-cp7. by analyzing the measurement principle of the psd, we designed a reverse bias circuit, i-v converted circuit, a/d converted circuit and control circuit which fpga as a controller, testing the output current value to verify the reasonableness of the circuit design, and calculate the location information according to formula. we also made a measured grid chart diagram and distortion based on the application of computer, so dose error analysis. we concluded that the linearity of this psd is better, and it can be applied in the high-precision systems. © 2015 spie.
收录类别EI ; ISTP
产权排序1
会议录aopc 2015: optical and optoelectronic sensing and imaging technology
会议录出版地spie
语种英语
ISSN号0277786x
源URL[http://ir.opt.ac.cn/handle/181661/27707]  
专题西安光学精密机械研究所_光电测量技术实验室
作者单位1.Photoelectric Measurment and Control Technology Research Dept., Xi'An Institute of Optics and Precision Mechanics of CAS, Xi'an, China
2.University of Chinese Academy of Science, Beijing, China
推荐引用方式
GB/T 7714
Zhou, Weixiang,Liang, Yanbing,Wang, Xiaoyang. A design of digital processing circuit for the duo-lateral PSD[C]. 见:applied optics and photonics, china: optical and optoelectronic sensing and imaging technology, aopc 2015. beijing, china. 2015-05-05.

入库方式: OAI收割

来源:西安光学精密机械研究所

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