中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Experimental study on three-dimensional ptychography for thick sample

文献类型:期刊论文

作者Pan An1,3; Zhang Xiao-Fei2,3; Wang Bin2,3; Zhao Qing1,3; Shi Yi-Shi3,4
刊名acta physica sinica
出版日期2016-01-05
卷号65期号:1页码:014204
关键词thick samples three-dimensional ptychography iterative engine multi-wavelength
ISSN号1000-3290
其他题名厚样品三维叠层衍射成像的实验研究
产权排序1
通讯作者shi, yi-shi (sysopt@126.com)
英文摘要ptychography is a new kind of lens-less imaging technology. what restricts the technique is the assumption of a multiplicative interaction between the illuminating coherent beam and the specimen, and the ptychography cannot be applied to samples thicker than a few tens of micrometers in the case of visible-light imaging at micron-scale resolution. in the present work, we split a sample into axial sections, thereby realize three-dimensional ptychographic imaging of thick samples at the millimeter level in a series of computer simulations and optical experiments. our simulation results reveal that by using single wavelength we cannot achieve good-quality images of thick samples. thus it is necessary to introduce more wavelengths for illumination. with increasing the number of wavelengths, the imaging quality of three-dimensional thick samples can be enhanced continually. then we make further study on the relationship between the imaging quality and the magnitude of wavelength in optical experiments by using two groups of samples with different thickness values. the results demonstrate that our experimental results are highly consistent with simulations. for our concrete configuration in this paper, the best results of imaging and separation may be obtained for the case of tri-wavelength. at the same time we make a reasonable explanation for the phenomenon of fold-over in the experiment. our results are important and meaningful for the practical utilizing of three-dimensional ptychography of thick samples.
WOS标题词science & technology ; physical sciences
学科主题数理科学和化学
类目[WOS]physics, multidisciplinary
研究领域[WOS]physics
关键词[WOS]microscopy ; resolution
收录类别SCI ; EI
语种中文
WOS记录号WOS:000370940200011
源URL[http://ir.opt.ac.cn/handle/181661/27810]  
专题西安光学精密机械研究所_瞬态光学技术国家重点实验室
作者单位1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, Xian 710119, Peoples R China
2.Chinese Acad Sci, Changchun Inst Opt Fine Mech & Phys, Changchun 130033, Peoples R China
3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
4.Chinese Acad Sci, Acad Optoelect, Beijing 100094, Peoples R China
推荐引用方式
GB/T 7714
Pan An,Zhang Xiao-Fei,Wang Bin,et al. Experimental study on three-dimensional ptychography for thick sample[J]. acta physica sinica,2016,65(1):014204.
APA Pan An,Zhang Xiao-Fei,Wang Bin,Zhao Qing,&Shi Yi-Shi.(2016).Experimental study on three-dimensional ptychography for thick sample.acta physica sinica,65(1),014204.
MLA Pan An,et al."Experimental study on three-dimensional ptychography for thick sample".acta physica sinica 65.1(2016):014204.

入库方式: OAI收割

来源:西安光学精密机械研究所

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