Application of Combined α-RBS and PIXE Analysis Technology
文献类型：期刊论文
| 作者 | Xia CH(夏琮璜); Shen DY(沈定予); Li SZ(李硕中); Liu SJ(刘士杰); Wang J(王江); Hu CH(胡朝晖) |
| 刊名 | Rare Metals
 |
| 出版日期 | 1992 |
| 期号 | 2页码:98-101 |
| 关键词 | RBS PIXE Channeling mode Ion Implantation GaAs |
| 英文摘要 | An analysis technique combining RBS with PIXE technology by x-particles incident beam was constructedand applied to analyse light impurities in heavier substrates.It can run in measuring Rutherford backscatteringand X-ray spectra in random and channeling mode,simultaneously.Being used to analyse... |
| 公开日期 | 2016-02-25 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/221219]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 推荐引用方式 GB/T 7714 | Xia CH,Shen DY,Li SZ,et al. Application of Combined α-RBS and PIXE Analysis Technology[J]. Rare Metals,1992(2):98-101. |
| APA | 夏琮璜,沈定予,李硕中,刘士杰,王江,&胡朝晖.(1992).Application of Combined α-RBS and PIXE Analysis Technology.Rare Metals(2),98-101. |
| MLA | 夏琮璜,et al."Application of Combined α-RBS and PIXE Analysis Technology".Rare Metals .2(1992):98-101. |
入库方式： OAI收割
来源：高能物理研究所
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