Structural studies of NixFe100-x/Mo magnetic multilayers by x-ray small-angle reflection and high-angle diffraction
文献类型：期刊论文
| 作者 | Luo GM ; Yan ML ; Mai ZH ; Lai WY ; Wang YT |
| 刊名 | physical review b
 |
| 出版日期 | 1997 |
| 卷号 | 56期号:6页码:3290-3295 |
| 关键词 | GIANT MAGNETORESISTANCE SUPERLATTICES FILMS |
| ISSN号 | 0163-1829 |
| 通讯作者 | luo gm chinese acad sciinst physpob 603beijing 100080peoples r china. |
| 中文摘要 | magnetic multilayers [nixfe100-x/mo-30] grown by dc-magnetron sputtering were investigated by x-ray small-angle reflection and high-angle diffraction. structural parameters of the multilayers such as the superlattice periods, the interfacial roughness, and interplane distance were obtained. it was found that for our nixfe100-x/mo system, the mo layer has bcc structure with [110] preferential orientation, while the preferential orientation of the nixfe100-x layer changes from a fee structure with [111] preferential orientation to a bcc structure with [110] preferential orientation with decreasing values of x. an intermixing layer located in the interlayer region between the nixfe100-x and mo layers exists in the multilayers, and its thickness is almost invariant with respect to an increase of mo layer thickness and/or a decrease of x in the region of x greater than or equal to 39. the thickness of the intermixing layer falls to zero when x less than or equal to 23. |
| 学科主题 | 半导体物理 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2010-11-17 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/15165]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Luo GM,Yan ML,Mai ZH,et al. Structural studies of NixFe100-x/Mo magnetic multilayers by x-ray small-angle reflection and high-angle diffraction[J]. physical review b,1997,56(6):3290-3295. |
| APA | Luo GM,Yan ML,Mai ZH,Lai WY,&Wang YT.(1997).Structural studies of NixFe100-x/Mo magnetic multilayers by x-ray small-angle reflection and high-angle diffraction.physical review b,56(6),3290-3295. |
| MLA | Luo GM,et al."Structural studies of NixFe100-x/Mo magnetic multilayers by x-ray small-angle reflection and high-angle diffraction".physical review b 56.6(1997):3290-3295. |
入库方式： OAI收割
来源：半导体研究所
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