中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Photoluminescence spectroscopy of sputtering Er-doped silicon-rich silicon nitride films

文献类型:期刊论文

作者Zuo Yuhua; Cheng Buwen
刊名半导体学报
出版日期2009
卷号30期号:10页码:1-4
中文摘要er-doped silicon-rich silicon nitride (srn) films were deposited on silicon substrate by an rf magnetron reaction sputtering system. after high temperature annealing, the films show intense photoluminescence in both the visible and infrared regions. besides broad-band luminescence centered at 780 nm which originates from silicon nanocrystals, resolved peaks due to transitions from all high energy levels up to ~2h_(11/2) to the ground state of er~(3+) are observed. raman spectra and hrtem measurements have been performed to investigate the structure of the films, and possible excitation processes are discussed.
学科主题光电子学
收录类别CSCD
资助信息the national natural science foundation of china,the state key development program for basic research of china
语种英语
公开日期2010-11-23
源URL[http://ir.semi.ac.cn/handle/172111/15699]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Zuo Yuhua,Cheng Buwen. Photoluminescence spectroscopy of sputtering Er-doped silicon-rich silicon nitride films[J]. 半导体学报,2009,30(10):1-4.
APA Zuo Yuhua,&Cheng Buwen.(2009).Photoluminescence spectroscopy of sputtering Er-doped silicon-rich silicon nitride films.半导体学报,30(10),1-4.
MLA Zuo Yuhua,et al."Photoluminescence spectroscopy of sputtering Er-doped silicon-rich silicon nitride films".半导体学报 30.10(2009):1-4.

入库方式: OAI收割

来源:半导体研究所

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