近衍射极限半导体激光束波面检测
文献类型：期刊论文
| ; | |
| 作者 | 刘宏展 ; 刘立人 ; 徐荣伟 ; 栾竹 ; 滕树云 |
| 刊名 | 中国激光
 |
| 出版日期 | 2005 |
| 卷号 | 32期号:4页码:519 |
| 关键词 | 光通信 optical communication 双剪切干涉仪 double-shearing interferometer 发散度 divergence angle 衍射极限 diffraction-limited |
| ISSN号 | 0258-7025 |
| 其他题名 | Measuring Near the Diffraction-Limited Wavefront of Semiconductor Laser Beam |
| 中文摘要 | 在星间半导体激光通信系统中，如何检测发射光束波面的质量是个较难处理的问题，为了较好地解决这一问题，在简单介绍白光横向双剪切干涉仪的基础上，报道了用此干涉仪对近衍射极限半导体激光光束波面的检测，在此基础上推导出计算远场发散度的公式。实验测得近场光束的波高差为0．2A，通过夫朗和费衍射求得光束的发散度仅为64．8μrad，这表明光束接近光学衍射极限。同时，表明双剪切干涉仪灵敏度高、实用性好。; In the semiconductor intersatellite communication system, how to test the laser beams′ quality is difficult. In order to solve this problem, a basal principle of the white light lateral double-shearing interferometer is introduced firstly, and then measuring the semiconductor laser beam′s wavefront which is near the diffraction-limited by the interferometer is reported, and the formula of calculating the beam′s divergence is deduced according to the Fraunhofer diffraction. A 0.2λ wavefront error is gained experimentally. Corresponding to the wavefront error, the divergence angle is only 64.8 μrad, which indicates the beam is near the diffraction-limited. The result shows that the interferometer has high precision and wide practicability. |
| 学科主题 | 激光器;半导体激光器 |
| 分类号 | TN929.13;O436.1 |
| 收录类别 | ei |
| 语种 | 中文 |
| 公开日期 | 2009-09-18 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/1330]  |
| 专题 | 上海光学精密机械研究所_信息光学开放实验室 |
| 推荐引用方式 GB/T 7714 | 刘宏展,刘立人,徐荣伟,等. 近衍射极限半导体激光束波面检测, Measuring Near the Diffraction-Limited Wavefront of Semiconductor Laser Beam[J]. 中国激光,2005,32(4):519, 522. |
| APA | 刘宏展,刘立人,徐荣伟,栾竹,&滕树云.(2005).近衍射极限半导体激光束波面检测.中国激光,32(4),519. |
| MLA | 刘宏展,et al."近衍射极限半导体激光束波面检测".中国激光 32.4(2005):519. |
入库方式： OAI收割
来源：上海光学精密机械研究所
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