中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Engineering of forming-free resistive switching characteristics in ZrO2 films

文献类型:期刊论文

作者Du, G(杜刚); Li, T(李涛); Wang, C(王超); Fang, B(方彬); Zhang, BS(张宝顺); Zeng, ZM(曾中明)
刊名JOURNAL OF PHYSICS D-APPLIED PHYSICS
出版日期2015
卷号48期号:22页码:6
关键词resistive random access memory (RRAM) forming-free oxygen vacancy thermal annealing
通讯作者Du, G (杜刚)
英文摘要The variation of forming-free resistive switching (RS) characteristics modulated by thermal annealing was investigated in ZrO2 films fabricated by electron beam evaporation. A typical forming-free behavior with pristine resistance comparable to that of the high resistance state (HRS) was observed in the as-deposited devices. Whereas, the resistance was further reduced to a state with initial resistance even lower than the low resistance state (LRS) after annealing in N-2 ambient and a larger resistance ratio was verified in the annealed devices. Both devices exhibited stable bipolar RS without any forming step, which has great potential for memory applications. A possible RS mechanism associated with adjusting of oxygen vacancy formation and migration was proposed to explain these distinct forming-free behaviors. It is expected that controllable forming-free characteristics and improved device performance may be obtained by further optimizing the distribution and density of oxygen vacancies via post-annealing.
收录类别SCI
语种英语
源URL[http://ir.sinano.ac.cn/handle/332007/3356]  
专题苏州纳米技术与纳米仿生研究所_纳米加工公共平台
推荐引用方式
GB/T 7714
Du, G,Li, T,Wang, C,et al. Engineering of forming-free resistive switching characteristics in ZrO2 films[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2015,48(22):6.
APA Du, G,Li, T,Wang, C,Fang, B,Zhang, BS,&Zeng, ZM.(2015).Engineering of forming-free resistive switching characteristics in ZrO2 films.JOURNAL OF PHYSICS D-APPLIED PHYSICS,48(22),6.
MLA Du, G,et al."Engineering of forming-free resistive switching characteristics in ZrO2 films".JOURNAL OF PHYSICS D-APPLIED PHYSICS 48.22(2015):6.

入库方式: OAI收割

来源:苏州纳米技术与纳米仿生研究所

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