Engineering of forming-free resistive switching characteristics in ZrO2 films
文献类型:期刊论文
作者 | Du, G(杜刚); Li, T(李涛); Wang, C(王超); Fang, B(方彬); Zhang, BS(张宝顺)![]() ![]() |
刊名 | JOURNAL OF PHYSICS D-APPLIED PHYSICS
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出版日期 | 2015 |
卷号 | 48期号:22页码:6 |
关键词 | resistive random access memory (RRAM) forming-free oxygen vacancy thermal annealing |
通讯作者 | Du, G (杜刚) |
英文摘要 | The variation of forming-free resistive switching (RS) characteristics modulated by thermal annealing was investigated in ZrO2 films fabricated by electron beam evaporation. A typical forming-free behavior with pristine resistance comparable to that of the high resistance state (HRS) was observed in the as-deposited devices. Whereas, the resistance was further reduced to a state with initial resistance even lower than the low resistance state (LRS) after annealing in N-2 ambient and a larger resistance ratio was verified in the annealed devices. Both devices exhibited stable bipolar RS without any forming step, which has great potential for memory applications. A possible RS mechanism associated with adjusting of oxygen vacancy formation and migration was proposed to explain these distinct forming-free behaviors. It is expected that controllable forming-free characteristics and improved device performance may be obtained by further optimizing the distribution and density of oxygen vacancies via post-annealing. |
收录类别 | SCI |
语种 | 英语 |
源URL | [http://ir.sinano.ac.cn/handle/332007/3356] ![]() |
专题 | 苏州纳米技术与纳米仿生研究所_纳米加工公共平台 |
推荐引用方式 GB/T 7714 | Du, G,Li, T,Wang, C,et al. Engineering of forming-free resistive switching characteristics in ZrO2 films[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2015,48(22):6. |
APA | Du, G,Li, T,Wang, C,Fang, B,Zhang, BS,&Zeng, ZM.(2015).Engineering of forming-free resistive switching characteristics in ZrO2 films.JOURNAL OF PHYSICS D-APPLIED PHYSICS,48(22),6. |
MLA | Du, G,et al."Engineering of forming-free resistive switching characteristics in ZrO2 films".JOURNAL OF PHYSICS D-APPLIED PHYSICS 48.22(2015):6. |
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