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Online fragments-based scale invariant electro-optic tracking with SIFT

文献类型：期刊论文

作者Cui, Xiongwen1,2; Wu, Qingzhang1; Zhou, Jin1
刊名OPTIK
出版日期2015
卷号126期号:18页码:1720-1725
关键词Object tracking Fragments-based SIFT MCC anti-projection Scale-invariant Partial occlusion
ISSN号0030-4026
英文摘要A novel online fragments-based scale invariant electro-optic tracking algorithm is proposed to deal with partial occlusion and cluttered background. First, the bounding box of the object is divided into equal-size fragments. A criterion based on FBE (Forward Backward Error) is adopted to select reliable fragments that are used to seek the location of the object. Then, the size of the bounding box is calculated with SIFT (Scale Invariant Feature Transform) keypoints modified via geometry constraints regularly. Finally, fragments are updated separately by combining SAD (Sum of Absolute Difference) with MGC (Major Gray Component) anti-projection to distinguish partial occlusion from appearance changes of the object itself every frame. Numerical experiments certificate that the proposed algorithm outperform state-of-the-art trackers on plentiful video sequences, especially, under conditions of scale changes of the object and occlusion. (C) 2015 Elsevier GmbH. All rights reserved.
WOS标题词Science & Technology ; Physical Sciences
类目[WOS]Optics
研究领域[WOS]Optics
收录类别SCI
语种英语
WOS记录号WOS:000364272300035
公开日期2016-02-26
源URL[http://ir.ioe.ac.cn/handle/181551/3758]  
专题光电技术研究所_光电技术研究所被WoS收录文章
作者单位1.Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714		 Cui, Xiongwen,Wu, Qingzhang,Zhou, Jin. Online fragments-based scale invariant electro-optic tracking with SIFT[J]. OPTIK,2015,126(18):1720-1725.
APA Cui, Xiongwen,Wu, Qingzhang,&Zhou, Jin.(2015).Online fragments-based scale invariant electro-optic tracking with SIFT.OPTIK,126(18),1720-1725.
MLA Cui, Xiongwen,et al."Online fragments-based scale invariant electro-optic tracking with SIFT".OPTIK 126.18(2015):1720-1725.

入库方式： OAI收割

来源：光电技术研究所

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