A Radial Stub Test Circuit for Microwave Power Devices
文献类型：期刊论文
| 作者 | Luo Weijun ; Chen Xiaojuan ; Liang Xiaoxin ; Ma Xiaolin ; Liu Xinyu ; Wang Xiaoliang |
| 刊名 | 半导体学报
 |
| 出版日期 | 2006 |
| 卷号 | 27期号:9页码:1557-1561 |
| 中文摘要 | with the principles of microwave circuits and semiconductor device physics, two microwave power device test circuits combined with a test fixture are designed and simulated, whose properties are evaluated by a parameter network analyzer within the frequency range from 3 to 8ghz. the simulation and experimental results verify that the test circuit with a radial stub is better than that without. as an example, a c-band algan/gan hemt microwave power device is tested with the designed circuit and fixture. with a 5.4ghz microwave input signal, the maximum gain is 8.75db, and the maximum output power is 33.2dbm. |
| 学科主题 | 半导体材料 |
| 收录类别 | CSCD |
| 资助信息 | 国家重点基础研究发展计划,中国科学院重点计划资助项目 |
| 语种 | 英语 |
| 公开日期 | 2010-11-23 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/16599]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Luo Weijun,Chen Xiaojuan,Liang Xiaoxin,et al. A Radial Stub Test Circuit for Microwave Power Devices[J]. 半导体学报,2006,27(9):1557-1561. |
| APA | Luo Weijun,Chen Xiaojuan,Liang Xiaoxin,Ma Xiaolin,Liu Xinyu,&Wang Xiaoliang.(2006).A Radial Stub Test Circuit for Microwave Power Devices.半导体学报,27(9),1557-1561. |
| MLA | Luo Weijun,et al."A Radial Stub Test Circuit for Microwave Power Devices".半导体学报 27.9(2006):1557-1561. |
入库方式： OAI收割
来源：半导体研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。