中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influence of growth and annealing temperature on the strain and surface morphology of Ge995Sn0.005 epilayer

文献类型:期刊论文

;
作者Su Shaojian; Zhang Dongliang; Xue Chunlai; Cheng Buwen
刊名applied surface science ; Applied Surface Science
出版日期2015 ; 2015
卷号340页码:132-137.
学科主题光电子学 ; 光电子学
收录类别SCI
语种英语 ; 英语
公开日期2016-02-16 ; 2016-02-16
源URL[http://ir.semi.ac.cn/handle/172111/26637]  
专题半导体研究所_光电子研究发展中心
推荐引用方式
GB/T 7714
Su Shaojian,Zhang Dongliang,Xue Chunlai,et al. Influence of growth and annealing temperature on the strain and surface morphology of Ge995Sn0.005 epilayer, Influence of growth and annealing temperature on the strain and surface morphology of Ge995Sn0.005 epilayer[J]. applied surface science, Applied Surface Science,2015, 2015,340, 340:132-137., 132-137..
APA Su Shaojian,Zhang Dongliang,Xue Chunlai,&Cheng Buwen.(2015).Influence of growth and annealing temperature on the strain and surface morphology of Ge995Sn0.005 epilayer.applied surface science,340,132-137..
MLA Su Shaojian,et al."Influence of growth and annealing temperature on the strain and surface morphology of Ge995Sn0.005 epilayer".applied surface science 340(2015):132-137..

入库方式: OAI收割

来源:半导体研究所

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