Breakdown of Shape Memory Effect in Bent Cu-Al-Ni Nanopillars: When Twin Boundaries Become Stacking Faults
文献类型：期刊论文
| 作者 | Liu LF(刘丽凤); Ding XD; Sun J; Li SZ; Salje EKH |
| 刊名 | NANO LETTERS
 |
| 出版日期 | 2016-01 |
| 卷号 | 16期号:1页码:194-198 |
| 通讯作者邮箱 | dingxd@mail.xjtu.edu.cn ; ekhard@esc.cam.ac.uk |
| 关键词 | finite size scaling shape memory effect size dependence of shape memory twinning stacking faults Cu-Al-Ni alloys |
| ISSN号 | 1530-6984 |
| 产权排序 | [Liu, Lifeng; Ding, Xiangdong; Sun, Jun; Li, Suzhi; Salje, Ekhard K. H.] Xi An Jiao Tong Univ, State Key Lab Mech Behav Mat, Xian 710049, Peoples R China; [Liu, Lifeng] Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100190, Peoples R China; [Salje, Ekhard K. H.] Univ Cambridge, Dept Earth Sci, Cambridge CB2 3EQ, England |
| 通讯作者 | Ding, XD (reprint author), Xi An Jiao Tong Univ, State Key Lab Mech Behav Mat, Xian 710049, Peoples R China. |
| 中文摘要 | Bent Cu-Al-Ni nanopillars (diameters 90-750 nm) show a shape memory effect, SME, for diameters D > 300 nm. The SME and the associated twinning are located in a small deformed section of the nanopillar. Thick nanopillars (D > 300 nm) transform to austenite under heating, including the deformed region. Thin nanopillars (D < 130 nm) do not twin but generate highly disordered sequences of stacking faults in the deformed region. No SME occurs and heating converts only the undeformed regions into austenite. The defect-rich, deformed region remains in the martensite phase even after prolonged heating in the stability field of austenite. A complex mixture of twins and stacking faults was found for diameters 130 nm < D < 300 nm. The size effect of the SME in Cu-Al-Ni nanopillars consists of an approximately linear reduction of the SME between 300 and 130 nm when the SME completely vanishes for smaller diameters. |
| 分类号 | 一类 |
| 类目[WOS] | Chemistry, Multidisciplinary ; Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter |
| 研究领域[WOS] | Chemistry ; Science & Technology - Other Topics ; Materials Science ; Physics |
| 关键词[WOS] | RESOLUTION ELECTRON-MICROSCOPY ; PHASE-TRANSFORMATION ; DEFORMATION ; ALLOYS ; NANOCRYSTALLINE ; PROPAGATION ; MARTENSITE ; TRANSITION ; MECHANISMS ; ORIGIN |
| 收录类别 | SCI ; EI |
| 原文出处 | http://dx.doi.org/10.1021/acs.nanolett.5b03483 |
| 语种 | 英语 |
| WOS记录号 | WOS:000368322700031 |
| 源URL | [http://dspace.imech.ac.cn/handle/311007/58642]  |
| 专题 | 力学研究所_非线性力学国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Liu LF,Ding XD,Sun J,et al. Breakdown of Shape Memory Effect in Bent Cu-Al-Ni Nanopillars: When Twin Boundaries Become Stacking Faults[J]. NANO LETTERS,2016,16(1):194-198. |
| APA | Liu LF,Ding XD,Sun J,Li SZ,&Salje EKH.(2016).Breakdown of Shape Memory Effect in Bent Cu-Al-Ni Nanopillars: When Twin Boundaries Become Stacking Faults.NANO LETTERS,16(1),194-198. |
| MLA | Liu LF,et al."Breakdown of Shape Memory Effect in Bent Cu-Al-Ni Nanopillars: When Twin Boundaries Become Stacking Faults".NANO LETTERS 16.1(2016):194-198. |
入库方式： OAI收割
来源：力学研究所
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