中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators

文献类型:期刊论文

作者Huitao Wang ; Dan Lu ; Hao Wang ; Fei Guo ; Songtao Liu ; Daibing Zhou ; Hongliang Zhu ; Wei Wang ; Yongguang Huang ; Ruikang Zhang ; Chen Ji
刊名ieee transactions on electron devices
出版日期2015
卷号62期号:11页码:3756-3759
学科主题半导体材料
收录类别SCI
语种英语
公开日期2016-03-29
源URL[http://ir.semi.ac.cn/handle/172111/26839]  
专题半导体研究所_中科院半导体材料科学重点实验室
推荐引用方式
GB/T 7714
Huitao Wang,Dan Lu,Hao Wang,et al. Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators[J]. ieee transactions on electron devices,2015,62(11):3756-3759.
APA Huitao Wang.,Dan Lu.,Hao Wang.,Fei Guo.,Songtao Liu.,...&Chen Ji.(2015).Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators.ieee transactions on electron devices,62(11),3756-3759.
MLA Huitao Wang,et al."Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators".ieee transactions on electron devices 62.11(2015):3756-3759.

入库方式: OAI收割

来源:半导体研究所

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