Structural, Raman scattering and magnetic characteristics of Er+-implanted GaN thin films
文献类型：期刊论文
| 作者 | Chao Liu ; Xingguo Gao ; Dongyan Tao ; Junxi Wang ; Yiping Zeng |
| 刊名 | journal of alloys and compounds
 |
| 出版日期 | 2015 |
| 卷号 | 618页码:533-536 |
| 学科主题 | 半导体材料 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2016-03-29 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/26843]  |
| 专题 | 半导体研究所_中科院半导体材料科学重点实验室 |
| 推荐引用方式 GB/T 7714 | Chao Liu,Xingguo Gao,Dongyan Tao,et al. Structural, Raman scattering and magnetic characteristics of Er+-implanted GaN thin films[J]. journal of alloys and compounds,2015,618:533-536. |
| APA | Chao Liu,Xingguo Gao,Dongyan Tao,Junxi Wang,&Yiping Zeng.(2015).Structural, Raman scattering and magnetic characteristics of Er+-implanted GaN thin films.journal of alloys and compounds,618,533-536. |
| MLA | Chao Liu,et al."Structural, Raman scattering and magnetic characteristics of Er+-implanted GaN thin films".journal of alloys and compounds 618(2015):533-536. |
入库方式： OAI收割
来源：半导体研究所
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