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Improved Epitaxy of 3C-SiC Layers on Si(100) by New CVD/LPCVD System

文献类型:期刊论文

作者Sun Guosheng ; Wang Lei ; Luo Muchang ; Zhao Wanshun ; Sun Dianzhao ; Zeng Yiping ; Li Jinmin ; Lin Lanying
刊名半导体学报
出版日期2002
卷号23期号:8页码:800-804
中文摘要single crystalline 3c-sic epitaxial layers are grown on φ50mm si wafers by a new resistively heated cvd/lpcvd system, using sih_4, c_2h_4 and h_2 as gas precursors. x-ray diffraction and raman scattering measurements are used to investigate the crystallinity of the grown films. electrical properties of the epitaxial 3c-sic layers with thickness of 1 ~ 3μm are measured by van der pauw method. the improved hall mobility reaches the highest value of 470cm~2/(v·s) at the carrier concentration of 7.7 * 10~(17)cm~(-3).
学科主题半导体材料
收录类别CSCD
资助信息国家基础研究专项基金(no. g2 683),国家高技术研究与发展基金(no. 2 1aa311 9 )
语种英语
公开日期2010-11-23
源URL[http://ir.semi.ac.cn/handle/172111/18073]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Sun Guosheng,Wang Lei,Luo Muchang,et al. Improved Epitaxy of 3C-SiC Layers on Si(100) by New CVD/LPCVD System[J]. 半导体学报,2002,23(8):800-804.
APA Sun Guosheng.,Wang Lei.,Luo Muchang.,Zhao Wanshun.,Sun Dianzhao.,...&Lin Lanying.(2002).Improved Epitaxy of 3C-SiC Layers on Si(100) by New CVD/LPCVD System.半导体学报,23(8),800-804.
MLA Sun Guosheng,et al."Improved Epitaxy of 3C-SiC Layers on Si(100) by New CVD/LPCVD System".半导体学报 23.8(2002):800-804.

入库方式: OAI收割

来源:半导体研究所

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