A 30 nm-resolution hard X-ray microscope with X-ray fluorescence mapping capability at BSRF
文献类型：期刊论文
| 作者 | Yuan QX(袁清习) ; Zhang K(张凯); Hong YL(洪友丽); Yuan, QX; Zhang, K; Hong, YL; Huang, WX; Gao, K; Wang, ZL; Zhu, PP
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| 刊名 | JOURNAL OF SYNCHROTRON RADIATION
 |
| 出版日期 | 2012 |
| 卷号 | 19期号:6页码:1021-1028 |
| 关键词 | hard X-ray transmission X-ray microscope fluorescence mapping capability trace-element mapping zone plate microscopy |
| 英文摘要 | A full-field transmission X-ray microscope (TXM) operating continuously from 5 keV to 12 keV with fluorescence mapping capability has been designed and constructed at the Beijing Synchrotron Radiation Facility, a first-generation synchrotron radiation facility operating at 2.5 GeV. Spatial resolution better than 30 nm has been demonstrated using a Siemens star pattern in both absorption mode and Zernike phase-contrast mode. A scanning-probe mode fluorescence mapping capability integrated with the TXM has been shown to provide 50 p. p. m. sensitivity for trace elements with a spatial resolution (limited by probing beam spot size) of 20 mm. The optics design, testing of spatial resolution and fluorescence sensitivity are presented here, including performance measurement results. |
| 学科主题 | Instruments & Instrumentation; Optics; Physics |
| 收录类别 | SCI |
| WOS记录号 | WOS:000310151000025 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/224096]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 推荐引用方式 GB/T 7714 | Yuan QX,Zhang K,Hong YL,et al. A 30 nm-resolution hard X-ray microscope with X-ray fluorescence mapping capability at BSRF[J]. JOURNAL OF SYNCHROTRON RADIATION,2012,19(6):1021-1028. |
| APA | 袁清习.,张凯.,洪友丽.,Yuan, QX.,Zhang, K.,...&吴自玉.(2012).A 30 nm-resolution hard X-ray microscope with X-ray fluorescence mapping capability at BSRF.JOURNAL OF SYNCHROTRON RADIATION,19(6),1021-1028. |
| MLA | 袁清习,et al."A 30 nm-resolution hard X-ray microscope with X-ray fluorescence mapping capability at BSRF".JOURNAL OF SYNCHROTRON RADIATION 19.6(2012):1021-1028. |
入库方式： OAI收割
来源：高能物理研究所
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