Scattering imaging method in transmission x-ray microscopy
文献类型：期刊论文
| 作者 | Chen, J; Gao, K; Ge, X; Wang, ZL; Zhang, K; Hong, YL; Pan, ZY; Wu, Z; Zhu, PP; Yun, WB |
| 刊名 | OPTICS LETTERS
 |
| 出版日期 | 2013 |
| 卷号 | 38期号:12页码:2068-2070 |
| 英文摘要 | We present a x-ray microscopy technique based on structured illumination in a microscope that characterizes the size of the subresolution-limit features. The technique is effective for characterizing fine structures substantially beyond the Rayleigh resolution of the microscope. We carried out optical experiments to demonstrate the basic principle of this new technique. Experimental results show good agreement with theoretical predictions. This technique should find a wide range of important imaging applications with a feature size down to nanometer scale, such as oil and gas reservoir rocks, advanced composites, and functional nanodevices and materials. (C) 2013 Optical Society of America |
| 学科主题 | Optics |
| 收录类别 | SCI |
| WOS记录号 | WOS:000320366500023 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/224187]  |
| 专题 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Chen, J,Gao, K,Ge, X,et al. Scattering imaging method in transmission x-ray microscopy[J]. OPTICS LETTERS,2013,38(12):2068-2070. |
| APA | Chen, J.,Gao, K.,Ge, X.,Wang, ZL.,Zhang, K.,...&吴自玉.(2013).Scattering imaging method in transmission x-ray microscopy.OPTICS LETTERS,38(12),2068-2070. |
| MLA | Chen, J,et al."Scattering imaging method in transmission x-ray microscopy".OPTICS LETTERS 38.12(2013):2068-2070. |
入库方式： OAI收割
来源：高能物理研究所
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