Extended depth of focus for transmission x-ray microscope
文献类型：期刊论文
| 作者 | Liu, YJ; Wang, JY; Hong YL(洪友丽) ; Hong, YL; Wang, ZL; Zhang, K; Williams, PA; Zhu, PP; Andrews, JC; Pianetta, P
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| 刊名 | OPTICS LETTERS
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| 出版日期 | 2012 |
| 卷号 | 37期号:17页码:3708-3710 |
| 英文摘要 | A fast discrete curvelet transform based focus-stacking algorithm for extending the depth of focus of a transmission x-ray microscope (TXM) is presented. By analyzing an image stack of a sample taken in a Z-scan, a fully in-focus image can be generated by the proposed scheme. With the extended depth of focus, it is possible to obtain 3D structural information over a large volume at nanometer resolution. The focus-stacking method has been demonstrated using a dataset taken with a laboratory x-ray source based TXM system. The possibility and limitations of generalizing this method to a synchrotron based TXM are also discussed. We expect the proposed method to be of important impact in 3D x-ray microscopy. (c) 2012 Optical Society of America |
| 学科主题 | Optics |
| 收录类别 | SCI |
| WOS记录号 | WOS:000308595300078 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/224238]  |
| 专题 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Liu, YJ,Wang, JY,Hong YL,et al. Extended depth of focus for transmission x-ray microscope[J]. OPTICS LETTERS,2012,37(17):3708-3710. |
| APA | Liu, YJ.,Wang, JY.,洪友丽.,Hong, YL.,Wang, ZL.,...&吴自玉.(2012).Extended depth of focus for transmission x-ray microscope.OPTICS LETTERS,37(17),3708-3710. |
| MLA | Liu, YJ,et al."Extended depth of focus for transmission x-ray microscope".OPTICS LETTERS 37.17(2012):3708-3710. |
入库方式： OAI收割
来源：高能物理研究所
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