Electronic Structure of BiFe1-xMnxO3 Thin Films Investigated by X-Ray Absorption Spectroscopy
文献类型：期刊论文
| 作者 | Ablat, A; Muhemmed, E; Si C(姒程); Wang JO(王嘉鸥) ; Qian HJ(钱海杰); Kui RX(奎热西); Zhang N(张念); Si, C; Wang, JO; Qian, HJ
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| 刊名 | JOURNAL OF NANOMATERIALS
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| 出版日期 | 2012 |
| 页码 | 123438 |
| 英文摘要 | Multiferroic polycrystalline BiFe1-xMnxO3 (0 <= x <= 0.3) thin films have been prepared on the Pt(111)/Ti/SiO2/Si(100) substrates by pulsed laser deposition method. The influence of Mn substitution on the electronic structure and magnetic properties has been studied. X-ray diffraction spectroscopy shows that Mn substitution slightly modulates crystal structure of the BiFe1-xMnxO3 system within the same structural phase. According to Fe L edge X ray absorption spectroscopy, Fe ions are found to be formally trivalent for doping amount x in BiFe(1-x)MnxO(3). The enhanced magnetization by increasing Mn content is attributed to an alternation degree of hybridization between Fe 3d-O 2p and Mn 3d-O 2p orbitals, basing on the carefully examined Fe L and O K edge X-ray absorption spectroscopy. The crystal structural and the electronic structural results show a causal relation between them by demonstrating intrinsic mutual dependence between respective variations. |
| 学科主题 | Science & Technology - Other Topics; Materials Science |
| 收录类别 | SCI |
| WOS记录号 | WOS:000306014200001 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/224637]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 推荐引用方式 GB/T 7714 | Ablat, A,Muhemmed, E,Si C,et al. Electronic Structure of BiFe1-xMnxO3 Thin Films Investigated by X-Ray Absorption Spectroscopy[J]. JOURNAL OF NANOMATERIALS,2012:123438. |
| APA | Ablat, A.,Muhemmed, E.,姒程.,王嘉鸥.,钱海杰.,...&Ibrahim, K.(2012).Electronic Structure of BiFe1-xMnxO3 Thin Films Investigated by X-Ray Absorption Spectroscopy.JOURNAL OF NANOMATERIALS,123438. |
| MLA | Ablat, A,et al."Electronic Structure of BiFe1-xMnxO3 Thin Films Investigated by X-Ray Absorption Spectroscopy".JOURNAL OF NANOMATERIALS (2012):123438. |
入库方式： OAI收割
来源：高能物理研究所
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