Signal-to-noise ratio analysis of X-ray grating interferometry with the reverse projection extraction method
文献类型：期刊论文
| ; | |
| 作者 | Wu, Z; Wang, ZL; Gao, K; Wang, DJ; Wang, SH; Chen, J; Chen, H; Zhang, K; Zhu, PP; Wu, ZY;张凯 |
| 刊名 | JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
 ; JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
|
| 出版日期 | 2014 ; 2014 |
| 卷号 | 196期号:SI页码:75-79 |
| 关键词 | Grating-based X-ray phase contrast imaging Photon statistics Mechanical errors Signal-to-noise ratio Grating-based X-ray phase contrast imaging Photon statistics Mechanical errors Signal-to-noise ratio |
| ISSN号 | 0368-2048 |
| DOI | 10.1016/j.elspec.2014.04.011 |
| 英文摘要 | In the past decade, grating-based X-ray phase contrast imaging has attracted increasing attention. Particular efforts have been devoted to develop new information extraction method for its forthcoming practical applications. Here we discuss the noise properties of a new acquisition protocol, dubbed the "reverse projection" (RP) method, using the error propagation formula. We present a quantitative analysis of the signal-to-noise ratio of X-ray grating interferometry with this new method. As the major sources of noise, the contributions from photon statistics and mechanical errors are discussed in detail. The results show how the system parameters impact on the extracted absorption and refraction images and how they can be used to optimize the system design for foreseen practical applications, such as biomedical imaging and materials science. (C) 2014 Elsevier B.V. All rights reserved.; In the past decade, grating-based X-ray phase contrast imaging has attracted increasing attention. Particular efforts have been devoted to develop new information extraction method for its forthcoming practical applications. Here we discuss the noise properties of a new acquisition protocol, dubbed the "reverse projection" (RP) method, using the error propagation formula. We present a quantitative analysis of the signal-to-noise ratio of X-ray grating interferometry with this new method. As the major sources of noise, the contributions from photon statistics and mechanical errors are discussed in detail. The results show how the system parameters impact on the extracted absorption and refraction images and how they can be used to optimize the system design for foreseen practical applications, such as biomedical imaging and materials science. (C) 2014 Elsevier B.V. All rights reserved. |
| 学科主题 | Spectroscopy ; Spectroscopy |
| 收录类别 | SCI |
| 电子版国际标准刊号 | 1873-2526 |
| 语种 | 英语 |
| WOS记录号 | WOS:000345823400016 ; WOS:000345823400016 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/225076]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 推荐引用方式 GB/T 7714 | Wu, Z,Wang, ZL,Gao, K,et al. Signal-to-noise ratio analysis of X-ray grating interferometry with the reverse projection extraction method, Signal-to-noise ratio analysis of X-ray grating interferometry with the reverse projection extraction method[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,2014, 2014,196, 196(SI):75-79, 75-79. |
| APA | Wu, Z.,Wang, ZL.,Gao, K.,Wang, DJ.,Wang, SH.,...&吴自玉.(2014).Signal-to-noise ratio analysis of X-ray grating interferometry with the reverse projection extraction method.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,196(SI),75-79. |
| MLA | Wu, Z,et al."Signal-to-noise ratio analysis of X-ray grating interferometry with the reverse projection extraction method".JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 196.SI(2014):75-79. |
入库方式： OAI收割
来源：高能物理研究所
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