Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method
文献类型:期刊论文
作者 | Zhang, H; Wang, BY; Zhang, Z; Wang, P; Wei, L; Jia, QJ; Wang, YZ; Jia QJ(贾全杰)![]() |
刊名 | HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
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出版日期 | 2005 |
卷号 | 29页码:#REF! |
关键词 | FeS2 synchrotron radiation surface X-ray diffraction semiconducting materials |
通讯作者 | Zhang, H (reprint author), Chinese Acad Sci, Inst High Energy Phys, Key Lab Nucl Anal Tech, Beijing 100049, Peoples R China. |
英文摘要 | Both conventional X-ray diffraction (XRD) and synchrotron radiation surface X-ray diffraction methods were used to study FeS2 films prepared by magnetron sputtering on Si (100) and glass substrates for comparison. The results show that the preferred orientation of FeS2 along (311) direction, which might be due to the well-matched crystal lattice for FeS2 and Si (100), is mistaken. The peak at about 56 degrees with extremely strong intensity comes from the (311) crystal plane of the silicon substrate, other than the preferred orientation of FeS2. The conclusion is proved by both calculation and experimental measurements in present paper.. |
学科主题 | Physics |
类目[WOS] | Physics, Nuclear ; Physics, Particles & Fields |
收录类别 | SCI |
WOS记录号 | WOS:000234206900009 |
公开日期 | 2016-05-03 |
源URL | [http://ir.ihep.ac.cn/handle/311005/225632] ![]() |
专题 | 高能物理研究所_多学科研究中心 |
推荐引用方式 GB/T 7714 | Zhang, H,Wang, BY,Zhang, Z,et al. Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method[J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2005,29:#REF!. |
APA | Zhang, H.,Wang, BY.,Zhang, Z.,Wang, P.,Wei, L.,...&贾全杰.(2005).Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method.HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,29,#REF!. |
MLA | Zhang, H,et al."Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method".HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION 29(2005):#REF!. |
入库方式: OAI收割
来源:高能物理研究所
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