Simulation and error analysis of electro-optic sampling measurement of ultrashort electron beam bunch length
文献类型：期刊论文
| 作者 | Sun DR(孙大睿) ; Xu JQ(徐金强); Tang K(唐坤); Sun, DR; Xu, JQ; Tang, K
|
| 刊名 | CHINESE PHYSICS C
 |
| 出版日期 | 2008 |
| 卷号 | 32期号:1页码:#REF! |
| 关键词 | electro-optic sampling ultrashort electron beam bunch measurement of electron bunch length |
| 其他题名 | 电光采样(EOS）法测量超短电子束束团长度中的模拟计算与误差分析 |
| 通讯作者 | Sun, DR (reprint author), Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China. |
| 英文摘要 | For the development of high energy physics, it is needed to improve the performance of the relativistic electron bunch. The measurement of the ultrashort relativistic electron pulse becomes one of the key technologies. The electro-optic sampling measurement of relativistic electron pulses is a promising method. This method is nondestructive, non-intrusive, and real-time monitoring. Distance and angles of the reference frames will cause system deviations. In this paper these system deviations are analyzed by simulation. It provides a reference for the experiment. |
| 学科主题 | Physics |
| 类目[WOS] | Physics, Nuclear ; Physics, Particles & Fields |
| 收录类别 | SCI |
| WOS记录号 | WOS:000255855900039 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/226303]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 推荐引用方式 GB/T 7714 | Sun DR,Xu JQ,Tang K,et al. Simulation and error analysis of electro-optic sampling measurement of ultrashort electron beam bunch length[J]. CHINESE PHYSICS C,2008,32(1):#REF!. |
| APA | 孙大睿,徐金强,唐坤,Sun, DR,Xu, JQ,&Tang, K.(2008).Simulation and error analysis of electro-optic sampling measurement of ultrashort electron beam bunch length.CHINESE PHYSICS C,32(1),#REF!. |
| MLA | 孙大睿,et al."Simulation and error analysis of electro-optic sampling measurement of ultrashort electron beam bunch length".CHINESE PHYSICS C 32.1(2008):#REF!. |
入库方式： OAI收割
来源：高能物理研究所
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