中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Effect of long anneals on the densities of threading dislocations in GaN films grown by metal-organic chemical vapor deposition

文献类型:期刊论文

作者Chen, ZT; Xu, K; Guo, LP; Yang, ZJ; Su, YY; Yang, XL; Pan, YB; Shen, B; Zhang, H; Zhang, GY
刊名JOURNAL OF CRYSTAL GROWTH
出版日期2006
卷号294期号:2页码:#REF!
关键词rocking curve stresses threading dislocation GaN thin films
通讯作者Zhang, GY (reprint author), Peking Univ, Sch Phys, Beijing 100871, Peoples R China.
英文摘要Effect of long anneals on densities of different types of threading dislocations (TDs) in GaN films grown onto sapphire substrate by metal-organic chemical vapor deposition was investigated by high-resolution X-ray diffraction. The results showed that the densities of both types of TDs changed obviously but oppositely, and residual stress in the GaN films was relaxed by generating edge-type TDs instead of screw-type TDs. The results obtained from chemical etching experiments and grazing-incidence X-ray diffraction (GIXRD) also supported the proposed defect structure evolution. (c) 2006 Elsevier B.V. All rights reserved.
学科主题Crystallography; Materials Science; Physics
类目[WOS]Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied
收录类别SCI
WOS记录号WOS:000240707800002
公开日期2016-05-03
源URL[http://ir.ihep.ac.cn/handle/311005/226563]  
专题高能物理研究所_多学科研究中心
推荐引用方式
GB/T 7714
Chen, ZT,Xu, K,Guo, LP,et al. Effect of long anneals on the densities of threading dislocations in GaN films grown by metal-organic chemical vapor deposition[J]. JOURNAL OF CRYSTAL GROWTH,2006,294(2):#REF!.
APA Chen, ZT.,Xu, K.,Guo, LP.,Yang, ZJ.,Su, YY.,...&Zhang, GY.(2006).Effect of long anneals on the densities of threading dislocations in GaN films grown by metal-organic chemical vapor deposition.JOURNAL OF CRYSTAL GROWTH,294(2),#REF!.
MLA Chen, ZT,et al."Effect of long anneals on the densities of threading dislocations in GaN films grown by metal-organic chemical vapor deposition".JOURNAL OF CRYSTAL GROWTH 294.2(2006):#REF!.

入库方式: OAI收割

来源:高能物理研究所

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