Study on pyrite FeS2 films deposited on Si(100) substrate by synchrotron radiation surface X-ray diffraction method
文献类型：期刊论文
| 作者 | Wan DY(万冬云); He Q(何庆); Jia QJ(贾全杰) ; Zhang RG(张仁刚); Zhang H(张辉); Wang BY(王宝义); Wei L(魏龙); Wan, DY; He, Q; Zhang, LP
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| 刊名 | JOURNAL OF CRYSTAL GROWTH
 |
| 出版日期 | 2004 |
| 卷号 | 268期号:1-2页码:#REF! |
| 关键词 | synchrotron radiation surface X-ray diffraction iron pyrite films semiconducting materials |
| 通讯作者 | Wei, L (reprint author), Chinese Acad Sci, Inst High Energy Phys, Key Lab Nucl Anal Tech, 10 Yuquan Rd, Beijing 100039, Peoples R China. |
| 英文摘要 | . Synchrotron radiation with surface X-ray diffraction is conducted to study pyrite FeS2 films on Si (10 0) wafers. The results show that the "strong (2 0 0) reflection" for the FeS2/Si(1 0 0) sample primarily comes from the stress peak of the silicon substrate, other than the effect of the preferred orientation of pyrite crystal grains which has been assumed previously. On the contrary, the FeS2/Si(1 0 0) sample actually indicates a strong preferred growth along (3 1 1) orientation, and this preferential growth of pyrite films becomes intenser with the prolonged annealing time. (C) 2004 Elsevier B.V. All rights reserved. |
| 学科主题 | Crystallography; Materials Science; Physics |
| 类目[WOS] | Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied |
| 收录类别 | SCI |
| WOS记录号 | WOS:000222714700035 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/227030]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 推荐引用方式 GB/T 7714 | Wan DY,He Q,Jia QJ,et al. Study on pyrite FeS2 films deposited on Si(100) substrate by synchrotron radiation surface X-ray diffraction method[J]. JOURNAL OF CRYSTAL GROWTH,2004,268(1-2):#REF!. |
| APA | 万冬云.,何庆.,贾全杰.,张仁刚.,张辉.,...&Wei, L.(2004).Study on pyrite FeS2 films deposited on Si(100) substrate by synchrotron radiation surface X-ray diffraction method.JOURNAL OF CRYSTAL GROWTH,268(1-2),#REF!. |
| MLA | 万冬云,et al."Study on pyrite FeS2 films deposited on Si(100) substrate by synchrotron radiation surface X-ray diffraction method".JOURNAL OF CRYSTAL GROWTH 268.1-2(2004):#REF!. |
入库方式： OAI收割
来源：高能物理研究所
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