Microstructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2
文献类型：期刊论文
| 作者 | Liu, CX; Chen, XM; Wang, Y; Xu, M; Luo, GM; Mai, ZH; Tang, WH; Gao, J; Jia, QJ; Zheng, WL |
| 刊名 | THIN SOLID FILMS
 |
| 出版日期 | 2003 |
| 卷号 | 437期号:1-2页码:#REF! |
| 关键词 | YBCO thin films microstructure SEM AFM |
| 通讯作者 | Liu, CX (reprint author), Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China. |
| 英文摘要 | By using Eu2CuO4 (ECO) as a buffer layer, extremely smooth surface YBa2Cu3O7-x (YBCO) thin film on yttrium stabilized ZrO2 substrates was obtained. The microstructure of YBCO thin films with or without ECO buffer layer were studied by atomic force microscopy, scanning electron microscopy and X-ray techniques. It was found that the epitaxy and crystallinity and surface of the YBCO thin films have been significantly enhanced with ECO buffer layer. (C) 2003 Elsevier Science B.V All rights reserved. |
| 学科主题 | Materials Science; Physics |
| 类目[WOS] | Materials Science, Multidisciplinary ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter |
| 收录类别 | SCI |
| WOS记录号 | WOS:000184367600040 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/227326]  |
| 专题 | 高能物理研究所_多学科研究中心 中国科学院高能物理研究所_人力资源处 |
| 推荐引用方式 GB/T 7714 | Liu, CX,Chen, XM,Wang, Y,et al. Microstructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2[J]. THIN SOLID FILMS,2003,437(1-2):#REF!. |
| APA | Liu, CX.,Chen, XM.,Wang, Y.,Xu, M.,Luo, GM.,...&陈中军.(2003).Microstructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2.THIN SOLID FILMS,437(1-2),#REF!. |
| MLA | Liu, CX,et al."Microstructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2".THIN SOLID FILMS 437.1-2(2003):#REF!. |
入库方式： OAI收割
来源：高能物理研究所
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