EFFECTS OF SECONDARY INTERACTIONS ON THIN-FILM THICKNESS MEASUREMENTS USING XRF
文献类型：期刊论文
| 作者 | Fan QM(范钦敏); FAN, QM |
| 刊名 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
 |
| 出版日期 | 1991 |
| 卷号 | 58期号:2页码:#REF! |
| 通讯作者 | FAN, QM (reprint author), INST HIGH ENERGY PHYS,BEIJING 100080,PEOPLES R CHINA. |
| 英文摘要 | The effects of secondary interactions induced by the substrate or a second film on thin film thickness measurements by X-ray fluorescence are described for both single-layer-film-substrate and double-layer-film-substrate systems. |
| 学科主题 | Instruments & Instrumentation; Nuclear Science & Technology; Physics |
| 类目[WOS] | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics, Atomic, Molecular & Chemical ; Physics, Nuclear |
| 收录类别 | SCI |
| WOS记录号 | WOS:A1991FW56200029 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/227424]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 推荐引用方式 GB/T 7714 | Fan QM,FAN, QM. EFFECTS OF SECONDARY INTERACTIONS ON THIN-FILM THICKNESS MEASUREMENTS USING XRF[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,1991,58(2):#REF!. |
| APA | 范钦敏,&FAN, QM.(1991).EFFECTS OF SECONDARY INTERACTIONS ON THIN-FILM THICKNESS MEASUREMENTS USING XRF.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,58(2),#REF!. |
| MLA | 范钦敏,et al."EFFECTS OF SECONDARY INTERACTIONS ON THIN-FILM THICKNESS MEASUREMENTS USING XRF".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 58.2(1991):#REF!. |
入库方式： OAI收割
来源：高能物理研究所
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