中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers

文献类型:期刊论文

作者Xu, M; Luo, GM; Chai, CL; Mai, ZH; Lai, WY; Wu, ZH; Wang, DW; Xu M(徐明); Wu ZH(吴忠华); Wang DW(王德武)
刊名JOURNAL OF CRYSTAL GROWTH
出版日期2000
卷号212期号:1-2页码:#REF!
关键词[Ni80Fe20/Cu](15) multilayers DC-magnetron sputtering microstructure X-ray diffraction
通讯作者Xu, M (reprint author), Chinese Acad Sci, Inst Phys, POB 603-79, Beijing 100080, Peoples R China.
英文摘要[Ni80Fe20/Cu](15) multilayers grown by DC-magnetron sputtering and annealed at different temperatures and/or times were investigated by low- and high-angle X-ray diffraction. Structural parameters such as superlattice period, interplane distance, average multilayer coherence length and interfacial roughness were obtained. It was found that as the annealing temperature increases the superlattice period, interplane distance, average multilayer coherence length decrease, while (1 1 1) preferred orientation of the superlattices was improved slightly. The interfacial roughness increases with increasing annealing temperature and/or time. A significant intermixing layer located in the interlayer region between the Ni80Fe20 and Cu layers was revealed by simulating the high-angle X-ray diffraction profiles. The thickness of the intermixing layer increases as the annealing temperature or annealing time increases. (C) 2000 Elsevier Science B.V. All rights reserved.
学科主题Crystallography; Materials Science; Physics
类目[WOS]Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied
收录类别SCI
WOS记录号WOS:000086678100041
公开日期2016-05-03
源URL[http://ir.ihep.ac.cn/handle/311005/227450]  
专题高能物理研究所_多学科研究中心
高能物理研究所_粒子天体物理中心
推荐引用方式
GB/T 7714
Xu, M,Luo, GM,Chai, CL,et al. Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers[J]. JOURNAL OF CRYSTAL GROWTH,2000,212(1-2):#REF!.
APA Xu, M.,Luo, GM.,Chai, CL.,Mai, ZH.,Lai, WY.,...&王德武.(2000).Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers.JOURNAL OF CRYSTAL GROWTH,212(1-2),#REF!.
MLA Xu, M,et al."Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers".JOURNAL OF CRYSTAL GROWTH 212.1-2(2000):#REF!.

入库方式: OAI收割

来源:高能物理研究所

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