Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers
文献类型：期刊论文
| 作者 | Xu, M; Luo, GM; Chai, CL; Mai, ZH; Lai, WY; Wu, ZH; Wang, DW; Xu M(徐明) ; Wu ZH(吴忠华); Wang DW(王德武)
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| 刊名 | JOURNAL OF CRYSTAL GROWTH
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| 出版日期 | 2000 |
| 卷号 | 212期号:1-2页码:#REF! |
| 关键词 | [Ni80Fe20/Cu](15) multilayers DC-magnetron sputtering microstructure X-ray diffraction |
| 通讯作者 | Xu, M (reprint author), Chinese Acad Sci, Inst Phys, POB 603-79, Beijing 100080, Peoples R China. |
| 英文摘要 | [Ni80Fe20/Cu](15) multilayers grown by DC-magnetron sputtering and annealed at different temperatures and/or times were investigated by low- and high-angle X-ray diffraction. Structural parameters such as superlattice period, interplane distance, average multilayer coherence length and interfacial roughness were obtained. It was found that as the annealing temperature increases the superlattice period, interplane distance, average multilayer coherence length decrease, while (1 1 1) preferred orientation of the superlattices was improved slightly. The interfacial roughness increases with increasing annealing temperature and/or time. A significant intermixing layer located in the interlayer region between the Ni80Fe20 and Cu layers was revealed by simulating the high-angle X-ray diffraction profiles. The thickness of the intermixing layer increases as the annealing temperature or annealing time increases. (C) 2000 Elsevier Science B.V. All rights reserved. |
| 学科主题 | Crystallography; Materials Science; Physics |
| 类目[WOS] | Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied |
| 收录类别 | SCI |
| WOS记录号 | WOS:000086678100041 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/227450]  |
| 专题 | 高能物理研究所_多学科研究中心 高能物理研究所_粒子天体物理中心 |
| 推荐引用方式 GB/T 7714 | Xu, M,Luo, GM,Chai, CL,et al. Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers[J]. JOURNAL OF CRYSTAL GROWTH,2000,212(1-2):#REF!. |
| APA | Xu, M.,Luo, GM.,Chai, CL.,Mai, ZH.,Lai, WY.,...&王德武.(2000).Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers.JOURNAL OF CRYSTAL GROWTH,212(1-2),#REF!. |
| MLA | Xu, M,et al."Effect of annealing on the microstructure of Ni80Fe20/Cu multilayers".JOURNAL OF CRYSTAL GROWTH 212.1-2(2000):#REF!. |
入库方式： OAI收割
来源：高能物理研究所
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