Microstructural characterization of spin-valve multilayers by X-ray anomalous diffraction technique
文献类型：期刊论文
| 作者 | Liu, CX; Xu, M; Luo, GM; Yang, T; Chai, CC; Mai, ZH; Lai, WY; Jiang, HY; Wu, ZH; Ding, YF |
| 刊名 | MODERN PHYSICS LETTERS B
 |
| 出版日期 | 2001 |
| 卷号 | 15期号:9-10页码:#REF! |
| 通讯作者 | Liu, CX (reprint author), Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China. |
| 英文摘要 | It is impossible to directly analyze the microstructure of spin-valve multilayers based on Ni, Fe, Cu and Mn by a conventional X-ray diffraction technique because the lattice parameter and atomic scattering factors of them are very close. To solve this problem, we use an X-ray anomalous diffraction technique to characterize the microstructures of the [Ni80Fe20/Fe50Mn50](15) and [Ni80Fe20/CU](15) superlattice systems. The results show that more diffraction peaks and higher intensity in the reflectivity profile are observed when the incident energy is close to the absorption edge of the lighter element (Mn) in [Ni80Fe20/Fe50Mn50](15) multilayer systems and to the absorption edge of the heavier element (Cu) in the [Ni80Fe20/Cu](15) multilayer systems. The interface and periodic structure of (Ni80Fe20/Fe50Mn50](15) are more perfect than that of the (Ni80Fe20/Cu](15) superlattices. The above results are discussed in this paper. |
| 学科主题 | Physics |
| 类目[WOS] | Physics, Applied ; Physics, Condensed Matter ; Physics, Mathematical |
| 收录类别 | SCI |
| WOS记录号 | WOS:000171344900005 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/227451]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 推荐引用方式 GB/T 7714 | Liu, CX,Xu, M,Luo, GM,et al. Microstructural characterization of spin-valve multilayers by X-ray anomalous diffraction technique[J]. MODERN PHYSICS LETTERS B,2001,15(9-10):#REF!. |
| APA | Liu, CX.,Xu, M.,Luo, GM.,Yang, T.,Chai, CC.,...&王江.(2001).Microstructural characterization of spin-valve multilayers by X-ray anomalous diffraction technique.MODERN PHYSICS LETTERS B,15(9-10),#REF!. |
| MLA | Liu, CX,et al."Microstructural characterization of spin-valve multilayers by X-ray anomalous diffraction technique".MODERN PHYSICS LETTERS B 15.9-10(2001):#REF!. |
入库方式： OAI收割
来源：高能物理研究所
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