Study of the diffusion behaviour of MoO3 and ZnO on oxide thin films by SR-TXRF
文献类型：期刊论文
| 作者 | Xu, WM; Xu, JQ; Wu, NZ; Yan, JF; Zhu, YF; Huang, YY; He, W; Xie, YC; Huang YY(黄宇营); He W(何伟)
|
| 刊名 | SURFACE AND INTERFACE ANALYSIS
 |
| 出版日期 | 2001 |
| 卷号 | 32期号:1页码:#REF! |
| 关键词 | MoO3 ZnO Al2O3 TiO2 SiO2 thin film SR-TXRF |
| 通讯作者 | Wu, NZ (reprint author), Beijing Univ, Inst Phys Chem, State Key Lab Struct Chem Unstable & Stable Speci, Beijing 100871, Peoples R China. |
| 英文摘要 | The diffusion process Of MoO3 and ZnO on stable oxide thin films (SiO2, Al2O3, TiO2) was investigated mainly by means of synchrotron-radiation-excited total reflection x-ray fluorescence spectroscopy (SR-TXRF). A stripe Of MoO3 or ZnO on the oxide thin film was used as the diffusion source. After thermal treatment, MoO3 diffused onto the surface of those films and formed a monolayer or a submonolayer. The diffusion capacity and the diffusion rate Of MoO3 on each film differed significantly. Sublimation of MoO3 also was detected during the diffusion process. A possible explanation for all the phenomena is the combination of surface diffusion onto the surface of the support and transportation via the gas phase. By contrast, ZnO hardly diffuses onto the surface of the film due to its high melting point. Copyright (C) 2001 John Wiley & Sons, Ltd. |
| 学科主题 | Chemistry |
| 类目[WOS] | Chemistry, Physical |
| 收录类别 | SCI |
| WOS记录号 | WOS:000170551800067 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/227510]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 推荐引用方式 GB/T 7714 | Xu, WM,Xu, JQ,Wu, NZ,et al. Study of the diffusion behaviour of MoO3 and ZnO on oxide thin films by SR-TXRF[J]. SURFACE AND INTERFACE ANALYSIS,2001,32(1):#REF!. |
| APA | Xu, WM.,Xu, JQ.,Wu, NZ.,Yan, JF.,Zhu, YF.,...&何伟.(2001).Study of the diffusion behaviour of MoO3 and ZnO on oxide thin films by SR-TXRF.SURFACE AND INTERFACE ANALYSIS,32(1),#REF!. |
| MLA | Xu, WM,et al."Study of the diffusion behaviour of MoO3 and ZnO on oxide thin films by SR-TXRF".SURFACE AND INTERFACE ANALYSIS 32.1(2001):#REF!. |
入库方式： OAI收割
来源：高能物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。