A statistical approach to fit Gaussian part of full-energy peaks from Si(PIN) and SDD X-ray spectrometers
文献类型：期刊论文
| 作者 | 李哲;Li, Z; Tuo, XG; Shi, R; Yang, JB |
| 刊名 | SCIENCE CHINA-TECHNOLOGICAL SCIENCES
 |
| 出版日期 | 2014 |
| 卷号 | 57期号:1页码:19-24 |
| 关键词 | Gaussian distribution Si(PIN) SDD EDXRF standard deviation of energy resolution |
| 英文摘要 | A new statistical fitting approach, named Statistical Distribution-Based Analytic (SDA) method, is proposed to fit single Gaussian-shaped K-alpha and K-beta X-ray peaks recorded by Si(PIN) and silicon drift detector (SDD). In this method, we use the discrete distribution theory to calculate standard deviation of energy resolution sigma. The calibration of sigma and energy (E) for two detectors between the energy ranges of 4.5-26 keV are also completed by measuring characteristic X-ray spectra of nineteen types of pure elements. With the spectrum fraction (SF) parameter proposed in this paper, the SDA method can be used to resolve overlapping peaks. In measured spectra, the Gaussian part of X-ray peaks can be fitted by a Gaussian function with two parameters, sigma and SF. This new fitting approach is simpler than traditional methods and it achieves relatively good results when fitting the complex X-ray spectra of national standard alloy samples detected by Si(PIN) and SDD detectors. The chi (r) (2) values are obtained for each spectrum to assess fitting results, and the SDA fitting method gives a preferable fit for the SDD detector. |
| 学科主题 | Engineering; Materials Science |
| 收录类别 | SCI |
| WOS记录号 | WOS:000329310200004 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/225362]  |
| 专题 | 高能物理研究所_核技术应用研究中心 |
| 推荐引用方式 GB/T 7714 | 李哲；Li, Z,Tuo, XG,Shi, R,et al. A statistical approach to fit Gaussian part of full-energy peaks from Si(PIN) and SDD X-ray spectrometers[J]. SCIENCE CHINA-TECHNOLOGICAL SCIENCES,2014,57(1):19-24. |
| APA | 李哲；Li, Z,Tuo, XG,Shi, R,&Yang, JB.(2014).A statistical approach to fit Gaussian part of full-energy peaks from Si(PIN) and SDD X-ray spectrometers.SCIENCE CHINA-TECHNOLOGICAL SCIENCES,57(1),19-24. |
| MLA | 李哲；Li, Z,et al."A statistical approach to fit Gaussian part of full-energy peaks from Si(PIN) and SDD X-ray spectrometers".SCIENCE CHINA-TECHNOLOGICAL SCIENCES 57.1(2014):19-24. |
入库方式： OAI收割
来源：高能物理研究所
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