中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
High Precision Standard Testing System for DCCT

文献类型:期刊论文

作者陈斌(加); Chen SY(陈素颖); Cheng J(程建); Zhang J(张旌); Chen, B; Chen, SY; Cheng, J; Zhang, J
刊名CHINESE PHYSICS C
出版日期2008
卷号32期号:1页码:#REF!
关键词DC current measuring system DCCT testing system high precision stabilized DC power supply
其他题名高精度直流传感器DCCT标准测试系统
通讯作者Chen, B (reprint author), CAS, Inst High Energy Phys, Beijing 100049, Peoples R China.
英文摘要In the BEPC II, a great deal of DCCTs, with current output, axe used as the measuring and feed-back units in power supplies. High Precision Standard Testing System for DCCT is designed and developed in order to detect and adjust the capability of DCCT. This testing system mainly consists of a PC computer, a 71/2 Digit Multimeter, a high precision DC current measuring system, and a high precision and stability power supply. The function and the structure of the testing system are simply analysed, and the test data are presented.
学科主题Physics
类目[WOS]Physics, Nuclear ; Physics, Particles & Fields
收录类别SCI
WOS记录号WOS:000255855900014
公开日期2016-05-03
源URL[http://ir.ihep.ac.cn/handle/311005/225701]  
专题高能物理研究所_加速器中心
推荐引用方式
GB/T 7714
Chen B,Chen SY,Cheng J,et al. High Precision Standard Testing System for DCCT[J]. CHINESE PHYSICS C,2008,32(1):#REF!.
APA 陈斌.,陈素颖.,程建.,张旌.,Chen, B.,...&Zhang, J.(2008).High Precision Standard Testing System for DCCT.CHINESE PHYSICS C,32(1),#REF!.
MLA 陈斌,et al."High Precision Standard Testing System for DCCT".CHINESE PHYSICS C 32.1(2008):#REF!.

入库方式: OAI收割

来源:高能物理研究所

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