Study of new substrate THGEMs with low neutron scattering and low radioactivity
文献类型:期刊论文
作者 | Zhang X(张烜)![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() |
刊名 | JOURNAL OF INSTRUMENTATION
![]() |
出版日期 | 2015 |
卷号 | 10页码:P10043 |
关键词 | Micropattern gaseous detectors (MSGC MICROPIC Neutron detectors (cold GEM MICROMEGAS thermal THGEM InGrid fast neutrons) RETHGEM etc) MHSP |
通讯作者 | 谢宇广 |
英文摘要 | New types of Thick Gaseous Electron Multipliers (THGEMs) made of PCB-type substrates, including Ceramic, Kapton, PTFE, and in addition to FR-4, were developed for applications requiring low neutron absorption, scattering, and low natural radioactivity, such as the THGEM-based neutron detector, and the THGEM-based gaseous multiplier (GPM). Using Geant4 simulation, the result of the total neutron absorption and scattering ratio of bare substrate is Kapton( high) > FR-4 > Ceramic > PTFE (low). The Ceramic and PTFE substrates have lower ratios about 0.707% and 0.635% per layer(0.2 mm thick) respectively. The gamma-induced electron background is the reverse, Ceramic > PTFE > FR-4 > Kapton, from 1.5% to 0.7% at 1.0MeV, which induces highest electron background in the range of 0 similar to 7 MeV. The natural radioactivity background was measured for these types of substrate samples. The Ceramic substrate has lower radioactivity, Th-232 = 8.8 +/- 0.9 Bq/kg, U-238 = 6.3 +/- 0.9 Bq/kg, and K-40 is too low to be detected. Some THGEM samples were produced by these four types of substrates in the same shape: 0.2-mm thickness, 0.2-mm hole diameter, 0.6-mm pitch, and 70-mu m rim. The performances of these new substrate THGEMs are promising. The effective gain is at the 10(4) level and the gain was stable during more than 100 hours continuous test. The energy resolution @Ar+IsoB = 97:3 is at the level of 20% to 27%. These new substrate THGEMs are available in 200x200 mm(2) size and even larger, some of them are applied to neutron flux monitor detector and gaseous photomultipliers (GPM). |
学科主题 | Instruments & Instrumentation |
类目[WOS] | Instruments & Instrumentation |
收录类别 | SCI |
WOS记录号 | WOS:000367674700045 |
公开日期 | 2016-05-03 |
源URL | [http://ir.ihep.ac.cn/handle/311005/229028] ![]() |
专题 | 高能物理研究所_实验物理中心 |
推荐引用方式 GB/T 7714 | Zhang X,Niu SL,Xie YG,et al. Study of new substrate THGEMs with low neutron scattering and low radioactivity[J]. JOURNAL OF INSTRUMENTATION,2015,10:P10043. |
APA | 张烜.,牛顺利.,谢宇广.,颜嘉庆.,吕军光.,...&L.(2015).Study of new substrate THGEMs with low neutron scattering and low radioactivity.JOURNAL OF INSTRUMENTATION,10,P10043. |
MLA | 张烜,et al."Study of new substrate THGEMs with low neutron scattering and low radioactivity".JOURNAL OF INSTRUMENTATION 10(2015):P10043. |
入库方式: OAI收割
来源:高能物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。