Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL
文献类型：期刊论文
| 作者 | Sun DR(孙大睿) ; Xu JQ(徐金强); Chen SY(陈森玉); Sun, DR; Xu, JQ; Chen, SY
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| 刊名 | CHINESE PHYSICS C
 |
| 出版日期 | 2010 |
| 卷号 | 34期号:2页码:#REF! |
| 关键词 | electro-optical sampling measurement of electron beam bunch length non-synchronous delay scanning technique |
| 通讯作者 | Sun, DR (reprint author), CAS, Inst High Energy Phys, Beijing 100049, Peoples R China. |
| 英文摘要 | The Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement. A novel non-synchronous delay scanning technique based on the electro-optical sampling measurements is presented. Based on Beijing Free Electron Laser (BFEL), the electron beam bunch length was measured with the electro-optical sampling technique for the first time in China. The result shows that the electron beam bunch length at BFEL is about 5.6 +/- 1.2 ps. |
| 学科主题 | Physics |
| 类目[WOS] | Physics, Nuclear ; Physics, Particles & Fields |
| 收录类别 | SCI |
| WOS记录号 | WOS:000274309200014 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/227062]  |
| 专题 | 高能物理研究所_院士 高能物理研究所_多学科研究中心 中国科学院高能物理研究所_所办公室 |
| 推荐引用方式 GB/T 7714 | Sun DR,Xu JQ,Chen SY,et al. Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL[J]. CHINESE PHYSICS C,2010,34(2):#REF!. |
| APA | 孙大睿,徐金强,陈森玉,Sun, DR,Xu, JQ,&Chen, SY.(2010).Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL.CHINESE PHYSICS C,34(2),#REF!. |
| MLA | 孙大睿,et al."Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL".CHINESE PHYSICS C 34.2(2010):#REF!. |
入库方式： OAI收割
来源：高能物理研究所
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