中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Suppression of indium droplet formation by adding CCl4 during metalorganic chemical vapor deposition growth of InN films

文献类型:期刊论文

作者Zhang SM; Yang H(杨辉)
刊名Semiconductor Science and Technology
出版日期2009-07
卷号24期号:7
通讯作者Wang H
合作状况其它
英文摘要In this work, the influences of CCl4 on the metalorganic chemical vapor deposition (MOCVD) growth of InN were studied for the first time. It was found that the addition of CCl4 can effectively suppress the formation of metal indium (In) droplets during InN growth, which was ascribed to the etching effect of Cl to In. However, with increasing of CCl4 flow, the InN growth rate decreased but the lateral growth of InN islands was enhanced. This provides a possibility of promoting islands coalescence toward a smooth surface of the InN film by MOCVD. The influence of addition of CCl4 on the electrical properties was also investigated.
收录类别SCI ; EI
语种英语
WOS记录号WOS:000267402800005
公开日期2010-01-15
源URL[http://58.210.77.100/handle/332007/134]  
专题苏州纳米技术与纳米仿生研究所_纳米器件及相关材料研究部_刘建平团队
推荐引用方式
GB/T 7714
Zhang SM,Yang H. Suppression of indium droplet formation by adding CCl4 during metalorganic chemical vapor deposition growth of InN films[J]. Semiconductor Science and Technology,2009,24(7).
APA Zhang SM,&Yang H.(2009).Suppression of indium droplet formation by adding CCl4 during metalorganic chemical vapor deposition growth of InN films.Semiconductor Science and Technology,24(7).
MLA Zhang SM,et al."Suppression of indium droplet formation by adding CCl4 during metalorganic chemical vapor deposition growth of InN films".Semiconductor Science and Technology 24.7(2009).

入库方式: OAI收割

来源:苏州纳米技术与纳米仿生研究所

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