中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Cathodoluminescence study on in composition inhomogeneity of thick InGaN layer

文献类型:期刊论文

作者Zhang SM; Yang H (杨辉)
刊名Thin Solid Films
出版日期2010-06-30
卷号518期号:17页码:5028-5031
关键词Gallium Nitride Indium Gallium Nitride Cathodeluminescence X-ray Diffraction Metal-Organic Chemical Vapor Deposition
通讯作者Wang H
合作状况其它
英文摘要We have investigated the optical properties of thick InGaN film grown on GaN by cathodeluminescence (CL) spectroscopy. It is found that there is obvious In composition variation in both growth and lateral direction of InGaN film. The depth distribution of In composition is closely related to the strain relaxation process of InGaN film. Accompanied with the relaxation of compressive strain, the In composition of InGaN layer increases and the CL peak energy shifts towards red. Moreover, a rather apparent In composition fluctuation is found in the relaxed upper part of InGaN layer as confirmed by CL imaging.
收录类别SCI ; EI
语种英语
WOS记录号WOS:000279566100048
公开日期2011-03-13
源URL[http://58.210.77.100/handle/332007/345]  
专题苏州纳米技术与纳米仿生研究所_纳米器件及相关材料研究部_刘建平团队
推荐引用方式
GB/T 7714
Zhang SM,Yang H . Cathodoluminescence study on in composition inhomogeneity of thick InGaN layer[J]. Thin Solid Films,2010,518(17):5028-5031.
APA Zhang SM,&Yang H .(2010).Cathodoluminescence study on in composition inhomogeneity of thick InGaN layer.Thin Solid Films,518(17),5028-5031.
MLA Zhang SM,et al."Cathodoluminescence study on in composition inhomogeneity of thick InGaN layer".Thin Solid Films 518.17(2010):5028-5031.

入库方式: OAI收割

来源:苏州纳米技术与纳米仿生研究所

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