中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Investigation on the compensation effect of residual carbon impurities in low temperature grown Mg doped GaN films

文献类型:期刊论文

作者Zhang SM(张书明); Yang H(杨辉); Liu JP(刘建平); Yang, J
刊名JOURNAL OF APPLIED PHYSICS
出版日期2014-04-28
卷号115期号:16
关键词CHEMICAL-VAPOR-DEPOSITION YELLOW LUMINESCENCE INTERSTITIAL CARBON MOVPE GROWTH LAYERS
通讯作者Zhao, DG
英文摘要The influence of unintentionally doped carbon impurities on electrical resistivity and yellow luminescence (YL) of low-temperature (LT) grown Mg doped GaN films is investigated. It is found that the resistivity of Mg doped GaN films are closely related to the residual carbon impurity concentration, which may be attributed to the compensation effect of carbon impurities. The carbon impurity may preferentially form deep donor complex C-N-O-N resulting from its relatively low formation energy. This complex is an effective compensate center for Mg-Ga acceptors as well as inducing YL in photoluminescence spectra. Thus, the low resistivity LT grown p-type GaN films can be obtained only when the residual carbon impurity concentration is sufficiently low, which can explain why LT P-GaN films with lower resistivity were obtained more easily when relatively higher pressure, temperature, or NH3/TMGa flow rate ratio were used in the LT grown Mg doped GaN films reported in earlier reports. (C) 2014 AIP Publishing LLC.
收录类别SCI
语种英语
WOS记录号WOS:000335228400034
公开日期2014-12-19
源URL[http://ir.sinano.ac.cn/handle/332007/1708]  
专题苏州纳米技术与纳米仿生研究所_纳米器件及相关材料研究部_刘建平团队
推荐引用方式
GB/T 7714
Zhang SM,Yang H,Liu JP,et al. Investigation on the compensation effect of residual carbon impurities in low temperature grown Mg doped GaN films[J]. JOURNAL OF APPLIED PHYSICS,2014,115(16).
APA Zhang SM,Yang H,Liu JP,&Yang, J.(2014).Investigation on the compensation effect of residual carbon impurities in low temperature grown Mg doped GaN films.JOURNAL OF APPLIED PHYSICS,115(16).
MLA Zhang SM,et al."Investigation on the compensation effect of residual carbon impurities in low temperature grown Mg doped GaN films".JOURNAL OF APPLIED PHYSICS 115.16(2014).

入库方式: OAI收割

来源:苏州纳米技术与纳米仿生研究所

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