High accuracy thermal resistance measurement in GaN/InGaN laser diodes
文献类型：期刊论文
| 作者 | Wen, PY(温鹏雁); Li, DY(李德尧); Zhang, SM(张书明); Liu, JP(刘建平) ; Zhang, LQ(张立群); Zhou, K(周堃); Feng, MX(冯美鑫); Li, ZC(李增成); Tian, AQ(田爱琴); Yang, H(杨辉)
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| 刊名 | SOLID-STATE ELECTRONICS
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| 出版日期 | 2015 |
| 卷号 | 106页码:4 |
| 关键词 | Thermal resistance Measurement GaN/InGaN laser diodes |
| 通讯作者 | Li, DY (李德尧) |
| 英文摘要 | A thermal resistance measurement method of high accuracy for GaN/InGaN laser diodes (LDs) is presented based on the forward-voltage method. Three items are optimized in order to improve the accuracy of the measurement. (i) Measurement time delay is shortened to 300 ns by using the single trigger function of a MD04104-3 Mixed Domain Oscilloscope. (ii) The measured results are revised based on the simulation result. (iii) The accuracy of the measurement is further improved by the real-time monitoring of the sensor current. Thermal resistance of the LD operating under different injection current is measured by using this method. The thermal resistance of TO56 packaged GaN/InGaN LD is 30.2 0.3 K/W. (C) 2015 Elsevier Ltd. All rights reserved. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 源URL | [http://ir.sinano.ac.cn/handle/332007/3399]  |
| 专题 | 苏州纳米技术与纳米仿生研究所_纳米器件及相关材料研究部_刘建平团队 |
| 推荐引用方式 GB/T 7714 | Wen, PY,Li, DY,Zhang, SM,et al. High accuracy thermal resistance measurement in GaN/InGaN laser diodes[J]. SOLID-STATE ELECTRONICS,2015,106:4. |
| APA | Wen, PY.,Li, DY.,Zhang, SM.,Liu, JP.,Zhang, LQ.,...&Yang, H.(2015).High accuracy thermal resistance measurement in GaN/InGaN laser diodes.SOLID-STATE ELECTRONICS,106,4. |
| MLA | Wen, PY,et al."High accuracy thermal resistance measurement in GaN/InGaN laser diodes".SOLID-STATE ELECTRONICS 106(2015):4. |
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