Contactless probing of the intrinsic carrier transport in single-walled carbon nanotubes
文献类型：期刊论文
| 作者 | Chen, LW (陈立桅) ; Lu, W (卢威)
|
| 刊名 | NANO RESEARCH
 |
| 出版日期 | 2014 |
| 卷号 | 7期号:11页码:1623-1630 |
| 关键词 | single-walled carbon nanotubes electronic transport dielectric force microscopy field-effect transistor carrier density carrier mobility |
| 通讯作者 | Chen, LW (陈立桅) |
| 英文摘要 |
Intrinsic carrier transport properties of single-walled carbon nanotubes have
been probed by two parallel methods on the same individual tubes: The contactless
dielectric force microscopy (DFM) technique and the conventional field-effect
transistor (FET) method. The dielectric responses of SWNTs are strongly correlated
with electronic transport of the corresponding FETs. The DC bias voltage in DFM
plays a role analogous to the gate voltage in FET. A microscopic model based on the
general continuity equation and numerical simulation is built to reveal the link
between intrinsic properties such as carrier concentration and mobility and the
macroscopic observable, i.e. dielectric responses, in DFM experiments. Local
transport barriers in nanotubes, which influence the device transport behaviors, are
also detected with nanometer scale resolution. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2015-02-03 |
| 源URL | [http://ir.sinano.ac.cn/handle/332007/1854]  |
| 专题 | 苏州纳米技术与纳米仿生研究所_纳米研究国际实验室_陈立桅团队 |
| 通讯作者 | Chen, LW (陈立桅) |
| 推荐引用方式 GB/T 7714 | Chen, LW ,Lu, W . Contactless probing of the intrinsic carrier transport in single-walled carbon nanotubes[J]. NANO RESEARCH,2014,7(11):1623-1630. |
| APA | Chen, LW ,&Lu, W .(2014).Contactless probing of the intrinsic carrier transport in single-walled carbon nanotubes.NANO RESEARCH,7(11),1623-1630. |
| MLA | Chen, LW ,et al."Contactless probing of the intrinsic carrier transport in single-walled carbon nanotubes".NANO RESEARCH 7.11(2014):1623-1630. |
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