Quantitative operando visualization of the energy band depth profile in solar cells
文献类型：期刊论文
| 作者 | Chen, Q(陈琪); Mao, L(毛霖); Li, YW(李耀文); Kong, T(孔涛); Wu, N(武娜); Ma, CQ(马昌期) ; Bai, S; Jin, YZ; Wu, D(吴丹); Lu, W(卢威)
|
| 刊名 | NATURE COMMUNICATIONS
 |
| 出版日期 | 2015 |
| 卷号 | 6页码:9 |
| 通讯作者 | Chen, LW (陈立桅) |
| 英文摘要 | The energy band alignment in solar cell devices is critically important because it largely governs elementary photovoltaic processes, such as the generation, separation, transport, recombination and collection of charge carriers. Despite the expenditure of considerable effort, the measurement of energy band depth profiles across multiple layers has been extremely challenging, especially for operando devices. Here we present direct visualization of the surface potential depth profile over the cross-sections of operando organic photovoltaic devices using scanning Kelvin probe microscopy. The convolution effect due to finite tip size and cantilever beam crosstalk has previously prohibited quantitative interpretation of scanning Kelvin probe microscopy-measured surface potential depth profiles. We develop a bias voltage-compensation method to address this critical problem and obtain quantitatively accurate measurements of the open-circuit voltage, built-in potential and electrode potential difference. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2016-05-03 |
| 源URL | [http://ir.sinano.ac.cn/handle/332007/3344]  |
| 专题 | 苏州纳米技术与纳米仿生研究所_纳米研究国际实验室_陈立桅团队 |
| 推荐引用方式 GB/T 7714 | Chen, Q,Mao, L,Li, YW,et al. Quantitative operando visualization of the energy band depth profile in solar cells[J]. NATURE COMMUNICATIONS,2015,6:9. |
| APA | Chen, Q.,Mao, L.,Li, YW.,Kong, T.,Wu, N.,...&Chen, LW.(2015).Quantitative operando visualization of the energy band depth profile in solar cells.NATURE COMMUNICATIONS,6,9. |
| MLA | Chen, Q,et al."Quantitative operando visualization of the energy band depth profile in solar cells".NATURE COMMUNICATIONS 6(2015):9. |
入库方式： OAI收割
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。