Quantitative measurement of domain inversion in RuO2 : LiNbO3 crystal by digital holographic interferometry
文献类型:期刊论文
作者 | Qu Weijuan ; Liu DA(刘德安) ; Zhi YN(职亚楠) ; Luan Zhu ; Liu LR(刘立人) ; Zhou YU(周煜u) ; Lu Wei ; Wang Chunhua |
刊名 | j. appl. phys.
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出版日期 | 2006 |
卷号 | 100期号:5页码:54108 |
关键词 | LITHIUM-NIOBATE CRYSTALS FRINGE-PATTERN ANALYSIS ELECTROOPTIC IMAGING MICROSCOPY FOURIER-TRANSFORM METHOD SITU VIDEO OBSERVATION LINBO3 CRYSTALS FERROELECTRIC DOMAINS CONGRUENT LINBO3 ELECTRIC-FIELDS INTERNAL FIELDS |
ISSN号 | 0021-8979 |
中文摘要 | we quantitatively study the domain inversion in a ruo2:linbo3 crystal wafer by the digital holographic interferometry. the crystal wafer is placed into one arm of a mach-zehnder-type interferometer to record a series of holograms. making use of the angular spectrum backward propagation algorithm, we reconstruct the optical wave field in the crystal plane. the extracted phase difference from the reconstructed optical wave field is a well linear function of the applied external voltage. we deduce that the linear electro-optic coefficient of the detected ruo2:linbo3 crystal sample is 9.1x10(-12) m/v. an unexpected phase contrast at the antiparallel domain wall is observed and the influence of the applied external voltage on it is studied in detail. also the built-in internal field is quantitatively measured as 0.72 kv/mm. (c) 2006 american institute of physics. |
收录类别 | EI |
语种 | 英语 |
公开日期 | 2009-09-18 |
源URL | [http://ir.siom.ac.cn/handle/181231/1842] ![]() |
专题 | 上海光学精密机械研究所_信息光学开放实验室 |
推荐引用方式 GB/T 7714 | Qu Weijuan,Liu DA,Zhi YN,et al. Quantitative measurement of domain inversion in RuO2 : LiNbO3 crystal by digital holographic interferometry[J]. j. appl. phys.,2006,100(5):54108. |
APA | Qu Weijuan.,刘德安.,职亚楠.,Luan Zhu.,刘立人.,...&Wang Chunhua.(2006).Quantitative measurement of domain inversion in RuO2 : LiNbO3 crystal by digital holographic interferometry.j. appl. phys.,100(5),54108. |
MLA | Qu Weijuan,et al."Quantitative measurement of domain inversion in RuO2 : LiNbO3 crystal by digital holographic interferometry".j. appl. phys. 100.5(2006):54108. |
入库方式: OAI收割
来源:上海光学精密机械研究所
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