中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns

文献类型:期刊论文

作者Tang, Y. L. ; Zhu, Y. L. ; Man, X. L.
刊名ULTRAMICROSCOPY
出版日期2016
卷号160页码:57-63
关键词Aberration-corrected scanning transmission electron microscopy High angle annular dark field (HAADF) Strain determination Geometrical phase analysis (GPA) Ferroelectric domain structure PbTiO3 films
ISSN号0304-3991
通讯作者xlma@imr.ac.cn
收录类别SCI
资助信息National Natural Science Foundation of China [51231007, 51171190]; National Basic Research Program of China [2014CB921002]
语种英语
公开日期2016-04-21
源URL[http://ir.imr.ac.cn/handle/321006/75031]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
Tang, Y. L.,Zhu, Y. L.,Man, X. L.. On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns[J]. ULTRAMICROSCOPY,2016,160:57-63.
APA Tang, Y. L.,Zhu, Y. L.,&Man, X. L..(2016).On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns.ULTRAMICROSCOPY,160,57-63.
MLA Tang, Y. L.,et al."On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns".ULTRAMICROSCOPY 160(2016):57-63.

入库方式: OAI收割

来源:金属研究所

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