Two-port calibration of test fixtures with OSL method.
文献类型：会议论文
| 作者 | Chen ZY ; Wang YL ; Liu Y ; Zhu NH |
| 出版日期 | 2002 |
| 会议名称 | 3rd international conference on microwave and millimeter wave technology |
| 会议日期 | aug 17-19, 2002 |
| 会议地点 | beijing, peoples r china |
| 关键词 | calibration microwave network analyzer scattering-parameter measurement phase uncertainty NETWORK-ANALYZER CALIBRATION LINE |
| 页码 | 138-141 |
| 通讯作者 | chen zy cas inst semicond state key lab integrated optoelect beijing 100083 peoples r china. |
| 中文摘要 | the open-short-load (osl) method is very simple and widely used, for one-port test fixture calibration. in this paper, this method. is extended to the two-port calibration of test fixtures for the first time. the problem of phase uncertainty arising in this application has been solved. the comparison between our results and those obtained with the short-open-load-thru (solt) method shows that the method established is accurate enough for practical applications. |
| 英文摘要 | the open-short-load (osl) method is very simple and widely used, for one-port test fixture calibration. in this paper, this method. is extended to the two-port calibration of test fixtures for the first time. the problem of phase uncertainty arising in this application has been solved. the comparison between our results and those obtained with the short-open-load-thru (solt) method shows that the method established is accurate enough for practical applications.; 于2010-10-29批量导入; made available in dspace on 2010-10-29t06:36:25z (gmt). no. of bitstreams: 1 2793.pdf: 217670 bytes, checksum: 2d582a13ed488ca5a6b0f11a7ba11583 (md5) previous issue date: 2002; chinese inst electr.; ieee microwave theory & techn soc.; ieee electron devices soc.; iee antennas & propagat soc.; electr soc, inst electr, informat & commun engineers japan.; korea inst telemat & electr.; ieee beijing sect.; iee beijing ctr.; ieee mtt s beijing chapter.; cas, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china |
| 收录类别 | CPCI-S |
| 会议主办者 | chinese inst electr.; ieee microwave theory & techn soc.; ieee electron devices soc.; iee antennas & propagat soc.; electr soc, inst electr, informat & commun engineers japan.; korea inst telemat & electr.; ieee beijing sect.; iee beijing ctr.; ieee mtt s beijing chapter. |
| 会议录 | 2002 3rd international conference on microwave and millimeter wave technology proceedings
 |
| 会议录出版者 | ieee ; 345 e 47th st, new york, ny 10017 usa |
| 学科主题 | 光电子学 |
| 会议录出版地 | 345 e 47th st, new york, ny 10017 usa |
| 语种 | 英语 |
| ISBN号 | 0-7803-7486-x |
| 源URL | [http://ir.semi.ac.cn/handle/172111/13607]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Chen ZY,Wang YL,Liu Y,et al. Two-port calibration of test fixtures with OSL method.[C]. 见:3rd international conference on microwave and millimeter wave technology. beijing, peoples r china. aug 17-19, 2002. |
入库方式： OAI收割
来源：半导体研究所
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