Choice of calibration equations of the TSM method
文献类型：会议论文
| 作者 | Wang YL ; Chen ZY ; Zhu NH |
| 出版日期 | 2002 |
| 会议名称 | 3rd international conference on microwave and millimeter wave technology |
| 会议日期 | aug 17-19, 2002 |
| 会议地点 | beijing, peoples r china |
| 关键词 | calibration network analyzer frequency limitation scattering-parameter measurement NETWORK-ANALYZER CALIBRATION TEST FIXTURES |
| 页码 | 150-153 |
| 通讯作者 | wang yl cas inst semicond state key lab integrated optoelect pob 912 beijing 100083 peoples r china. |
| 中文摘要 | for the reciprocal-test fixtures, there are six independent s-parameters to. be determined, and the thru-short-match (tsm) calibration can provide eight calibration equations. in this paper, the relation of calibration equations is investigated. it has been shown that the four equations obtained from the measurement with a transmission standard can be used simultaneously in the calibration. experimental results show that the different choice of equations will lead to quite different solution, and the calibration accuracy can be improved by taking advantages of the established relation among the calibration equations and properly choosing calibration equations. |
| 英文摘要 | for the reciprocal-test fixtures, there are six independent s-parameters to. be determined, and the thru-short-match (tsm) calibration can provide eight calibration equations. in this paper, the relation of calibration equations is investigated. it has been shown that the four equations obtained from the measurement with a transmission standard can be used simultaneously in the calibration. experimental results show that the different choice of equations will lead to quite different solution, and the calibration accuracy can be improved by taking advantages of the established relation among the calibration equations and properly choosing calibration equations.; 于2010-10-29批量导入; made available in dspace on 2010-10-29t06:36:26z (gmt). no. of bitstreams: 1 2795.pdf: 209946 bytes, checksum: 5a1a788ffa195644b70076e11ed03e39 (md5) previous issue date: 2002; chinese inst electr.; ieee microwave theory & techn soc.; ieee electron devices soc.; iee antennas & propagat soc.; electr soc, inst electr, informat & commun engineers japan.; korea inst telemat & electr.; ieee beijing sect.; iee beijing ctr.; ieee mtt s beijing chapter.; cas, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china |
| 收录类别 | CPCI-S |
| 会议主办者 | chinese inst electr.; ieee microwave theory & techn soc.; ieee electron devices soc.; iee antennas & propagat soc.; electr soc, inst electr, informat & commun engineers japan.; korea inst telemat & electr.; ieee beijing sect.; iee beijing ctr.; ieee mtt s beijing chapter. |
| 会议录 | 2002 3rd international conference on microwave and millimeter wave technology proceedings
 |
| 会议录出版者 | ieee ; 345 e 47th st, new york, ny 10017 usa |
| 学科主题 | 光电子学 |
| 会议录出版地 | 345 e 47th st, new york, ny 10017 usa |
| 语种 | 英语 |
| ISBN号 | 0-7803-7486-x |
| 源URL | [http://ir.semi.ac.cn/handle/172111/13611]  |
| 专题 | 半导体研究所_中国科学院半导体研究所（2009年前） |
| 推荐引用方式 GB/T 7714 | Wang YL,Chen ZY,Zhu NH. Choice of calibration equations of the TSM method[C]. 见:3rd international conference on microwave and millimeter wave technology. beijing, peoples r china. aug 17-19, 2002. |
入库方式： OAI收割
来源：半导体研究所
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