中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Electroluminescence and photoluminescence of Si/SiGe self-assembly quantum dot structures

文献类型:会议论文

作者Si JJ ; Yang QQ ; Wang HJ ; Wang QM
出版日期1998
会议名称conference on integrated optoelectronics ii
会议日期sep 18-19, 1998
会议地点beijing, peoples r china
关键词Si/SiGe quantum dot electroluminescence photoluminescence
页码49-52
通讯作者si jj chinese acad sci inst semicond state key lab integrated optoelect beijing 100083 peoples r china.
中文摘要comparative electroluminescence (el) and photoluminescence (pl) measurements were performed on si/si0.6ge0.4 self-assembly quantum dots (qds) structures. the samples were grown pseudomorphically by molecular beam epitaxy, and pin diodes for electroluminescence were fabricated. assisted tem pictures shows the sige self-assembly qds are platelike. and it showed that the diameters of qds are in range from 40nm to 140nm with the most in 120nm. both el and pl has a wide luminescence peak due to wide distribution of qds dimensions. at low temperature (t=14k), el peak has a red shift compared to the corresponding pl peak. its full-width at half-maximum (fwhm) is about 97mev, a little smaller than that of corresponding pl peak. the reasons of position and fwhm changes of el peak from qds have been discussed.
英文摘要comparative electroluminescence (el) and photoluminescence (pl) measurements were performed on si/si0.6ge0.4 self-assembly quantum dots (qds) structures. the samples were grown pseudomorphically by molecular beam epitaxy, and pin diodes for electroluminescence were fabricated. assisted tem pictures shows the sige self-assembly qds are platelike. and it showed that the diameters of qds are in range from 40nm to 140nm with the most in 120nm. both el and pl has a wide luminescence peak due to wide distribution of qds dimensions. at low temperature (t=14k), el peak has a red shift compared to the corresponding pl peak. its full-width at half-maximum (fwhm) is about 97mev, a little smaller than that of corresponding pl peak. the reasons of position and fwhm changes of el peak from qds have been discussed.; 于2010-10-29批量导入; made available in dspace on 2010-10-29t06:37:18z (gmt). no. of bitstreams: 1 3034.pdf: 815142 bytes, checksum: e6156a05a630870ba1e17dab7cf07ab6 (md5) previous issue date: 1998; spie int soc opt engn.; cos chinese opt soc.; coema.; chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china
收录类别CPCI-S
会议主办者spie int soc opt engn.; cos chinese opt soc.; coema.
会议录integrated optoelectronics ii, 3551
会议录出版者spie-int soc optical engineering ; 1000 20th st, po box 10, bellingham, wa 98227-0010 usa
学科主题光电子学
会议录出版地1000 20th st, po box 10, bellingham, wa 98227-0010 usa
语种英语
ISSN号0277-786x
ISBN号0-8194-3012-9
源URL[http://ir.semi.ac.cn/handle/172111/13863]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Si JJ,Yang QQ,Wang HJ,et al. Electroluminescence and photoluminescence of Si/SiGe self-assembly quantum dot structures[C]. 见:conference on integrated optoelectronics ii. beijing, peoples r china. sep 18-19, 1998.

入库方式: OAI收割

来源:半导体研究所

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