Electroluminescence and photoluminescence of Si/SiGe self-assembly quantum dot structures
文献类型:会议论文
作者 | Si JJ ; Yang QQ ; Wang HJ ; Wang QM |
出版日期 | 1998 |
会议名称 | conference on integrated optoelectronics ii |
会议日期 | sep 18-19, 1998 |
会议地点 | beijing, peoples r china |
关键词 | Si/SiGe quantum dot electroluminescence photoluminescence |
页码 | 49-52 |
通讯作者 | si jj chinese acad sci inst semicond state key lab integrated optoelect beijing 100083 peoples r china. |
中文摘要 | comparative electroluminescence (el) and photoluminescence (pl) measurements were performed on si/si0.6ge0.4 self-assembly quantum dots (qds) structures. the samples were grown pseudomorphically by molecular beam epitaxy, and pin diodes for electroluminescence were fabricated. assisted tem pictures shows the sige self-assembly qds are platelike. and it showed that the diameters of qds are in range from 40nm to 140nm with the most in 120nm. both el and pl has a wide luminescence peak due to wide distribution of qds dimensions. at low temperature (t=14k), el peak has a red shift compared to the corresponding pl peak. its full-width at half-maximum (fwhm) is about 97mev, a little smaller than that of corresponding pl peak. the reasons of position and fwhm changes of el peak from qds have been discussed. |
英文摘要 | comparative electroluminescence (el) and photoluminescence (pl) measurements were performed on si/si0.6ge0.4 self-assembly quantum dots (qds) structures. the samples were grown pseudomorphically by molecular beam epitaxy, and pin diodes for electroluminescence were fabricated. assisted tem pictures shows the sige self-assembly qds are platelike. and it showed that the diameters of qds are in range from 40nm to 140nm with the most in 120nm. both el and pl has a wide luminescence peak due to wide distribution of qds dimensions. at low temperature (t=14k), el peak has a red shift compared to the corresponding pl peak. its full-width at half-maximum (fwhm) is about 97mev, a little smaller than that of corresponding pl peak. the reasons of position and fwhm changes of el peak from qds have been discussed.; 于2010-10-29批量导入; made available in dspace on 2010-10-29t06:37:18z (gmt). no. of bitstreams: 1 3034.pdf: 815142 bytes, checksum: e6156a05a630870ba1e17dab7cf07ab6 (md5) previous issue date: 1998; spie int soc opt engn.; cos chinese opt soc.; coema.; chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china |
收录类别 | CPCI-S |
会议主办者 | spie int soc opt engn.; cos chinese opt soc.; coema. |
会议录 | integrated optoelectronics ii, 3551
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会议录出版者 | spie-int soc optical engineering ; 1000 20th st, po box 10, bellingham, wa 98227-0010 usa |
学科主题 | 光电子学 |
会议录出版地 | 1000 20th st, po box 10, bellingham, wa 98227-0010 usa |
语种 | 英语 |
ISSN号 | 0277-786x |
ISBN号 | 0-8194-3012-9 |
源URL | [http://ir.semi.ac.cn/handle/172111/13863] ![]() |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Si JJ,Yang QQ,Wang HJ,et al. Electroluminescence and photoluminescence of Si/SiGe self-assembly quantum dot structures[C]. 见:conference on integrated optoelectronics ii. beijing, peoples r china. sep 18-19, 1998. |
入库方式: OAI收割
来源:半导体研究所
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